{"id":419543,"date":"2024-10-20T06:26:28","date_gmt":"2024-10-20T06:26:28","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-62132-22011-2\/"},"modified":"2024-10-26T12:01:34","modified_gmt":"2024-10-26T12:01:34","slug":"bs-en-62132-22011-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-62132-22011-2\/","title":{"rendered":"BS EN 62132-2:2011"},"content":{"rendered":"

This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
7<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
8<\/td>\n4 General <\/td>\n<\/tr>\n
9<\/td>\n5 Test conditions
6 Test equipment
6.1 General
6.2 Cables
6.3 RF disturbance source <\/td>\n<\/tr>\n
10<\/td>\n6.4 TEM cell
6.5 Gigahertz TEM cell
6.6 50 \u03a9 termination
6.7 DUT monitor
7 Test set-up
7.1 General
7.2 Test set-up details <\/td>\n<\/tr>\n
11<\/td>\nFigures
Figure 1 \u2013 TEM and GTEM cell cross-section
Figure 2 \u2013 TEM cell test set-up <\/td>\n<\/tr>\n
12<\/td>\n7.3 EMC test board
8 Test procedure
8.1 General
8.2 Immunity measurement
Figure 3 \u2013 GTEM cell test set-up <\/td>\n<\/tr>\n
14<\/td>\n9 Test report
Figure 4 \u2013 Immunity measurement procedure flowchart <\/td>\n<\/tr>\n
15<\/td>\nAnnex A (normative) Field strength characterization procedure <\/td>\n<\/tr>\n
16<\/td>\nFigure A.1 \u2013 E field characterization test fixture <\/td>\n<\/tr>\n
18<\/td>\nFigure A.2 \u2013 The electric field to voltage transfer function <\/td>\n<\/tr>\n
21<\/td>\nFigure A.3 \u2013 H field characterization test fixture <\/td>\n<\/tr>\n
22<\/td>\nFigure A.4 \u2013 The magnetic field to voltage transfer function <\/td>\n<\/tr>\n
23<\/td>\nAnnex B (informative) TEM CELL and wideband TEM cell descriptions <\/td>\n<\/tr>\n
24<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Integrated circuits. Measurement of electromagnetic immunity – Measurement of radiated immunity. TEM cell and wideband TEM cell method<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2011<\/td>\n28<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":419552,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-419543","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/419543","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/419552"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=419543"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=419543"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=419543"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}