{"id":371597,"date":"2024-10-20T02:25:28","date_gmt":"2024-10-20T02:25:28","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61189-5-6012021\/"},"modified":"2024-10-26T04:12:45","modified_gmt":"2024-10-26T04:12:45","slug":"bs-en-iec-61189-5-6012021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61189-5-6012021\/","title":{"rendered":"BS EN IEC 61189-5-601:2021"},"content":{"rendered":"
IEC 61189-5-601:2021 specifies the reflow soldering ability test method for components mounted on organic rigid printed boards, the reflow heat resistance test method for organic rigid printed boards, and the reflow soldering ability test method for the lands of organic rigid printed boards in applications using solder alloys, which are eutectic or near-eutectic tin-lead (Pb), or lead-free alloys. The printed boards materials for this organic rigid printed boards are epoxide woven E-glass laminated sheets that are specified in IEC 61249-2 (all parts). The objective of this document is to ensure the soldering ability of the solder joint and of the lands of the printed boards. In addition, test methods are provided to ensure that the printed boards can resist the heat load to which they are exposed during soldering.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Annex ZA(normative)Normative references to international publications with their corresponding European publications <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 1 Scope 2 Normative references Tables Table 1 \u2013 Test items defined in this document <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4 Grouping of soldering processes and related test severities <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5 Specimens 5.1 Devices Table 2 \u2013 Grouping of soldering processes and typical test severities \u2013 Overview <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Figures Figure 1 \u2013 Example of a test circuit for the electrical continuity test of a solder joint Figure 2 \u2013 Example of area array type packages Figure 3 \u2013 Example of leaded type devices Figure 4 \u2013 Example of leadless termination type devices <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 5.2 Test substrate 5.3 Solder paste Figure 5 \u2013 Example of connector for card type devices Figure 6 \u2013 Example of shielding metal components <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.4 Solder ball 6 Apparatus and equipment 6.1 Constant temperature and humidity testing equipment Figure 7 \u2013 Recommended solder ball shape <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 6.2 Device-mounting equipment 6.3 X-ray transmission equipment 6.4 Electrical resistance recorder 6.5 Warpage measurement equipment Table 3 \u2013 Stencil design standard for devices <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 6.6 Temperature cycling chamber 6.7 Pull strength test equipment 7 Tg1 Solder joint initial quality after reflow 7.1 General 7.2 Specimen preparation 7.3 Pre-process 7.3.1 Pre-conditioning 7.3.2 Initial measurement Figure 8 \u2013 Test procedure for Tg1 <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 7.3.3 Moistening process (1) 7.3.4 Baking and warp correction 7.3.5 Pre-reflow heating 7.3.6 Moistening process (2) 7.4 Assembly process 7.4.1 Solder paste printing <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 7.4.2 Device mounting Figure 9 \u2013 Example of printed conditions of solder paste Figure 10 \u2013 Typical reflow soldering profile for Sn63Pb37 solder alloy <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Figure 11 \u2013 Typical reflow soldering profile for Sn96,5Ag3Cu,5 solder alloy <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Figure 12 \u2013 Reflow temperature profile for soldering ability Table 4 \u2013 Maximum reflow heating conditions <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 7.4.3 Reflow heating Figure 13 \u2013 Temperature measurement of the package device using thermocouples Figure 14 \u2013 Temperature measurement of other specimen using thermocouples Table 5 \u2013 Minimum reflow heating conditions <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 7.5 Recovery 7.6 Final measurement 8 Tg2 warpage of component and printed boards in reflow process 8.1 General 8.2 Specimen preparation Figure 15 \u2013 Test procedure for Tg2 <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 8.3 Assembly process 8.3.1 Initial measurement 8.3.2 Baking and warp correction 8.3.3 Pre-reflow heating 8.4 Final measurement 8.4.1 Warpage measurement 8.4.2 Measurement area 8.4.3 Gap measurement <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Figure 16 \u2013 Contact point <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 9 Tg3 Resistance to soldering heat of printed boards 9.1 General Figure 17 \u2013 Maximum gap <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 9.2 Specimen preparation 9.3 Pre-process 9.3.1 Pre-conditioning 9.3.2 Initial measurement 9.3.3 Moistening process (1) 9.3.4 Baking and warp correction 9.4 Reflow heating Figure 18 \u2013 Test procedure for Tg3 <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 9.5 Final measurement 10 Tg4 Wetting and dewetting of a printed-board land 10.1 General 10.2 Specimen preparation 10.3 Pre-process 10.3.1 Pre-conditioning Figure 19 \u2013 Test procedure for Tg4 <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 10.3.2 Initial measurement 10.3.3 Moistening process (1) 10.3.4 Pre-baking 10.3.5 Pre-reflow heating 10.3.6 Moistening process (2) 10.4 Assembly process 10.4.1 Solder paste printing 10.4.2 Reflow heating <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 10.5 Final measurement 10.5.1 Measurement Table 6 \u2013 Wetting level <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 10.5.2 Flux removal 11 Tg5 Resistance to dissolution of a printed-board land 11.1 General Figure 20 \u2013 State of solder wetting Figure 21 \u2013 Solder contact angle <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 11.2 Specimen preparation 11.3 Pre-process 11.3.1 Pre-conditioning 11.3.2 Initial measurement 11.4 Assembly process 11.4.1 Solder paste printing 11.4.2 Reflow heating 11.5 Final measurement 11.5.1 Observation Figure 22 \u2013 Test procedure for Tg5 <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 11.5.2 Observation method 11.5.3 Measurement Figure 23 \u2013 Evaluation of resistance to dissolution of land <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | 11.5.4 Example of influence upon occurrence of dissolution 12 Tg6 Pull strength of the test substrate land 12.1 General Figure 24 \u2013 Cross-section observation <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 12.2 Specimen preparation 12.3 Pre-process 12.3.1 Pre-conditioning 12.3.2 Initial measurement 12.3.3 Pre-baking 12.3.4 Pre-reflow heating 12.4 Assembly process 12.4.1 Solder paste printing 12.4.2 Solder ball placement Figure 25 \u2013 Test procedure for Tg6 <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 12.4.3 Reflow heating process 12.5 Final measurement 12.5.1 Pull strength measurement 12.5.2 Pull strength measuring method A \u2013 Probe heat bond method 12.5.3 Pull strength measuring method B \u2013 Ball pinch method Figure 26 \u2013 Measuring methods for pull strength <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 12.5.4 Pull strength measuring method C \u2013 Pin pull down method 12.5.5 Pull strength measuring method D \u2013 Lead pull method 12.5.6 Final observation <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | Figure 27 \u2013 Breaking modes in pull strength test <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | Annex A (informative)Test process items and meaning of processing contents and condition A.1 General A.2 Meaning of processing contents and condition A.3 Test process items Table A.1 \u2013 Meaning of processing contents and condition <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | Table A.2 \u2013 Test process items and clauses <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Test methods for electrical materials, printed boards and other interconnection structures and assemblies – General test methods for materials and assemblies. Reflow soldering ability test for solder joint, and reflow heat resistance test for printed boards<\/b><\/p>\n |