{"id":409308,"date":"2024-10-20T05:34:55","date_gmt":"2024-10-20T05:34:55","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-231702022\/"},"modified":"2024-10-26T10:13:53","modified_gmt":"2024-10-26T10:13:53","slug":"bs-iso-231702022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-231702022\/","title":{"rendered":"BS ISO 23170:2022"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Principle and recommendations of MEIS analysis <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5 MEIS analysis 6 MEIS spectra simulation <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 7 Reporting MEIS analysis results <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Annex A (informative) Interlaboratory test report <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Annex B (informative) List of MEIS spectra simulation program sources and a procedure of MEIS spectra simulation using PowerMeis <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | Annex C (informative) Reliability of the IAEA electronic stopping power data <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Annex D (informative) Fitting parameters A, B, C, D from the IAEA database <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering<\/b><\/p>\n |