🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
SAE AS 6171/2A:2017

SAE AS 6171/2A:2017

$25.35

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using Sem Test Methods

Published By Publication Date Number of Pages
SAE 2017-05-11 31
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

This document describes the requirements of the following test methods for counterfeit detection of electronic components:

  1. a

    Method A: General EVI, Sample Selection, and Handling
  2. b

    Method B: Detailed EVI, including Part Weight measurement
  3. c

    Method C: Testing for Remarking
  4. d

    Method D: Testing for Resurfacing
  5. e

    Method E: Part Dimensions measurement
  6. f

    Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

Related products

SAE AS 6171/2A:2017
$25.35