UNE-EN 60749-40:2011
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Semiconductor devices – Mechanical and climatic test methods – Part 40: Board level drop test method using a strain gauge
| Published By | Publication Date | Number of Pages |
| AENOR | 2011-11-01 | 26 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2011-11-01 |
| Pages Count | 26 |
| Language | English |
| File Size | 942.1 KB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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