UNE-EN 60749-28:2017
$26.65
Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
Published By | Publication Date | Number of Pages |
AENOR | 2017-08-01 | 52 |
Published Code | AENOR |
---|---|
Published By | Asociación Española de Normalización |
Publication Date | 2017-08-01 |
Pages Count | 52 |
Language | English |
File Size | 4.2 MB |
ICS Codes | 31.080.01 - Semiconductor devices in general |