{"id":79920,"date":"2024-10-17T18:39:12","date_gmt":"2024-10-17T18:39:12","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1226-2-1994\/"},"modified":"2024-10-24T19:41:49","modified_gmt":"2024-10-24T19:41:49","slug":"ieee-1226-2-1994","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1226-2-1994\/","title":{"rendered":"IEEE 1226.2 1994"},"content":{"rendered":"

New IEEE Standard – Inactive – Withdrawn. Ada packages that specify data types and services for the Ada-based ATLAS-level test procedure interface for a broad-based environment for test (ABBET) are defined. They are to be used to support the development of Ada- based, UUT-directed, signal-oriented test programs. IEEE ABBET uses the features of Ada to specify a comprehensive environment for integrating product design data, test requirements\/strategies, and test results management in the implementation of automated test systems and test control programs.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
15<\/td>\n1.0verview
1.1scope
1.2 purpose
1.3 Application <\/td>\n<\/tr>\n
16<\/td>\n2.References <\/td>\n<\/tr>\n
18<\/td>\n3.Definitions
3.1Keyterms
3.2 Abbreviations and acronyms <\/td>\n<\/tr>\n
19<\/td>\n4.Description
4.1 Objectives
4.2 Overview
Figure l-Hardware and software transition from UUT to instrument <\/td>\n<\/tr>\n
20<\/td>\n4.2.1 Test Resources and Classes
4.2.2 Ada implementation of the resource classes and objects <\/td>\n<\/tr>\n
21<\/td>\n4.2.3 Links between object classes
4.2.4 Structural overview of analog resources <\/td>\n<\/tr>\n
22<\/td>\n4.2.5 Structural overview of digital resources
4.2.6 Data bus testing structure
Figure 2-Structural overview of analog resources <\/td>\n<\/tr>\n
23<\/td>\n4.2.7 Resource allocation
Figure 3-Structural overview of digital resources
Figure 4-Data bus testing structure <\/td>\n<\/tr>\n
24<\/td>\n4.3 Relationship to ABBET architecture
Figure 5-ABBET architecture as defined in IEEE Std 1226-1993 <\/td>\n<\/tr>\n
25<\/td>\n4.3.1 ABBET conforming implementations
Figure GABBET test and diagnostic services <\/td>\n<\/tr>\n
26<\/td>\n4.4 Relationship to reference documents
Figure 7-Layered implementation of ABBET ALTPI and lower-level interfaces <\/td>\n<\/tr>\n
28<\/td>\n5.1 Test program structure
5.1.1 Program components
5.1.2 Test labeling <\/td>\n<\/tr>\n
29<\/td>\n5.1.3 Test encapsulation <\/td>\n<\/tr>\n
31<\/td>\n5.1.4 Multitasking support
5.1.5 Required resome instantiation <\/td>\n<\/tr>\n
33<\/td>\n5.1.6 Test program elaboration
Figure 8-ALTPI package elaboration order diagram
ANALOG-SIGNAL-MONITOR-CAPABILITY <\/td>\n<\/tr>\n
35<\/td>\n5.1.7 Status flag operations <\/td>\n<\/tr>\n
37<\/td>\n5.1.8 Test completion
5.2 Data processing
5.2.1 Authorized characters
5.2.2 Number representations <\/td>\n<\/tr>\n
38<\/td>\n5.2.3 Scope of identifiers
5.2.4 Program control
5.2.5 Computational operations
5.2.6 Mathematical operations
5.2.7 Digital data operations <\/td>\n<\/tr>\n
39<\/td>\n5.2.8 ABBET standard physical units
5.2.9 Physical data conversions <\/td>\n<\/tr>\n
40<\/td>\n5.3 InpuVoutput
5.3.1 File input\/output
5.3.2 Operator input\/output
5.4 Connection path requirements
5.4.1 Pin descriptors <\/td>\n<\/tr>\n
43<\/td>\n5.4.2 Connection identifiers <\/td>\n<\/tr>\n
46<\/td>\n5.4.3 Path description <\/td>\n<\/tr>\n
49<\/td>\n5.4.4 Connection error exception
5.5 Resource capability requirements
5.5.1 ANALOG-SENSOR-CAPAsILITY <\/td>\n<\/tr>\n
50<\/td>\n5.5.2 ANALOG-SOURCECAPABILITY <\/td>\n<\/tr>\n
51<\/td>\n5.5.3 SIMPLE-LOAD-CAPABILITY
5.5.4 TIME_INTERVAL-SENSOR_CAPABILITY
5.5.5 TIMER-SOURCE-CAPABILITY <\/td>\n<\/tr>\n
52<\/td>\n5.5.6 DIGITAL-SENSOR-CAPABILITY
5.5.7 DIGITAL-SOURCE-CAPABILITY <\/td>\n<\/tr>\n
53<\/td>\n5.6 Event monitor capability
5.6.1 ANALOG-SIGNAL-MONITOR-CAPABILITY
5.6.2 ANALOG-TIME-MO-R-CAPABILITY <\/td>\n<\/tr>\n
54<\/td>\n5.6.4 DIGITAL-EVENT-MONITOR-CAPABILm
5.7 Event monitor resources
5.7.1 ANALOG-SIGNAL-MONITOR <\/td>\n<\/tr>\n
55<\/td>\n5.7.2 ANALOG-TIME-MONITOR
5.7.3MANUAL-INTERVENTION <\/td>\n<\/tr>\n
56<\/td>\n5.7.4 DIGITAL-EVENT-MONITOR
5.8 UUT-directed virtual resources <\/td>\n<\/tr>\n
58<\/td>\n5.8.1 ANALOG-SENSOR <\/td>\n<\/tr>\n
60<\/td>\n5.8.2 ANALOG-SOURCE <\/td>\n<\/tr>\n
62<\/td>\n5.8.3 SIMPLE-LOAD <\/td>\n<\/tr>\n
63<\/td>\n5.8.4 TIME-INTERVALSENSOR <\/td>\n<\/tr>\n
64<\/td>\nPRIMARY-DATA-BUS <\/td>\n<\/tr>\n
65<\/td>\n5.8.5 TIMER-SOURCE <\/td>\n<\/tr>\n
66<\/td>\n5.8.6 DIGITAL-SENSOR
DO-DATA-BUS-EXCHANGE <\/td>\n<\/tr>\n
67<\/td>\n5.8.7 DIGITAL-SOURCE
ABBET-EVALUATIONS <\/td>\n<\/tr>\n
68<\/td>\n5.9 Signal oriented procedures <\/td>\n<\/tr>\n
69<\/td>\nVIRTUAL-RESOURCE-GROUP <\/td>\n<\/tr>\n
70<\/td>\n5.9.1 State transition diagrams
Figure 9-State diagram for a virtual analog source or load resource without event monitor <\/td>\n<\/tr>\n
71<\/td>\nFigure 1O-State diagram for a virtual analog source or load resource with an event monitor
ATLAS-CONTROL <\/td>\n<\/tr>\n
72<\/td>\nFigure 11Ptate diagram for a virtual analog Sensor without event monitor <\/td>\n<\/tr>\n
73<\/td>\nFigure 12State diagram for a virtual analog Sensor with an event monitor <\/td>\n<\/tr>\n
76<\/td>\n5.9.2 Single-action verbs <\/td>\n<\/tr>\n
77<\/td>\nFigure 13Single action verb illustration <\/td>\n<\/tr>\n
81<\/td>\n5.9.3 Multiple action verbs <\/td>\n<\/tr>\n
84<\/td>\n5.9.4 Digital verbs <\/td>\n<\/tr>\n
88<\/td>\n5.9.5 ANTICIPATE-VIA-CONNECTION Procedure <\/td>\n<\/tr>\n
89<\/td>\n5.10 Test timing and synchronization procedures
5.10.1 Timer Source WAIT and RESET procedures <\/td>\n<\/tr>\n
90<\/td>\n5.10.2 RESET-ALL-TIMERS RESET-TIMERS
5.10.3 DOSIMULTANEOUS
5.10.4 DO-TIMED-DIGITAL <\/td>\n<\/tr>\n
92<\/td>\n5.10.5 STIM-RATE-ONLY
5.10.6 STIM-EVENT-ONLY <\/td>\n<\/tr>\n
93<\/td>\n5.10.7 STIM-UTE-AND-SENSE-DELAY
5.10.8 STIM-RATE-AND-SENSE-EVENT
5.10.9 STIM-EVENT-AND-SENSE-DELAY <\/td>\n<\/tr>\n
94<\/td>\n5.10.10 STIM-EVENT-AND-SENSE-EVENT
5.10.11 SENSE-RATE-ONLY <\/td>\n<\/tr>\n
95<\/td>\n5.10.12 SENSE-EVENT-ONLY
5.1 1 Digital bus testing procedures <\/td>\n<\/tr>\n
96<\/td>\nFigure 14-Example single 1553B bus interfacing Several avionics systems <\/td>\n<\/tr>\n
98<\/td>\n5.12 Fiel4subfield data definitions <\/td>\n<\/tr>\n
99<\/td>\n5.12.1 ATLAS-TYPES <\/td>\n<\/tr>\n
111<\/td>\n5.12.2 NOUN-MODIFIER_TYPES <\/td>\n<\/tr>\n
118<\/td>\n5.12.3 RESOURCE-DESCRIPTION <\/td>\n<\/tr>\n
121<\/td>\n5.12.4 SIGNAL-DESCRIPTION <\/td>\n<\/tr>\n
129<\/td>\n5.12.5 SYNCHRONIZATION-TYPES <\/td>\n<\/tr>\n
137<\/td>\n5.12.7 DIGITAL-DESCRIPTION <\/td>\n<\/tr>\n
149<\/td>\n5.12.8 DATABUS-DESCRIPTION <\/td>\n<\/tr>\n
158<\/td>\n5.13 Nouns and their modifiers
5.13.1 Standard ATLAS nouns <\/td>\n<\/tr>\n
160<\/td>\n5.13.2 AC-SIGNAL (alternating current signal) <\/td>\n<\/tr>\n
161<\/td>\n5.13.3 ADF (Automatic direction finder) <\/td>\n<\/tr>\n
162<\/td>\n5.13.4 AM-SIGNAL (Amplitude modulation signal)
5.13.5 AMBIENT-CONDITIONS <\/td>\n<\/tr>\n
164<\/td>\n5.13.6 ATC (Air traffic control) <\/td>\n<\/tr>\n
165<\/td>\nFigure 16-ATC interrogation signal
Figure 17-ATC reply signal <\/td>\n<\/tr>\n
166<\/td>\n5.13.7 COMMON <\/td>\n<\/tr>\n
168<\/td>\n5.13.8 DC-SIGNAL (Direct current signal)
5.13.9 DISPLACEMENT
5.13.10 DME (Distance measuring equipment) <\/td>\n<\/tr>\n
169<\/td>\n5.13.11 DOPPLER <\/td>\n<\/tr>\n
170<\/td>\n5.13.12 EARTH <\/td>\n<\/tr>\n
171<\/td>\n5.13.13 EM-FIELD (Elect10 magnetic field)
5.13.14 EVENTS <\/td>\n<\/tr>\n
172<\/td>\n5.13.15 FLUID-SIGNAL <\/td>\n<\/tr>\n
174<\/td>\n5.13.16 FM-SIGNAL (Frequency modulation signal)
5.13.17 HEAT
Identification. friend or foe) <\/td>\n<\/tr>\n
176<\/td>\n5.13.19 ILS (Instrument landing system) <\/td>\n<\/tr>\n
178<\/td>\n5.13.2 IMPEDANCE
5.13.21 LIGHT
5.13.22 LOGIC-CONTROL <\/td>\n<\/tr>\n
179<\/td>\n5.13.23 LOGIC-DATA <\/td>\n<\/tr>\n
187<\/td>\n5.13.24 LOGIC-LOAD
Figure 18Defined voltage ranges for these examples <\/td>\n<\/tr>\n
188<\/td>\n5.13.25 LOGIC-REFERENCE <\/td>\n<\/tr>\n
189<\/td>\n5.13.26 MANOMETRIC
5.13.27 PAM (Pulse amplitude modulation) <\/td>\n<\/tr>\n
190<\/td>\n5.13.28 PM-SIGNAL (Phase modulated signal)
5.13.29 PULSED-AC (Pulsed alternation current signal) <\/td>\n<\/tr>\n
191<\/td>\n5.13.30 PULSED-AC-TRAIN <\/td>\n<\/tr>\n
192<\/td>\nFigure 19-Pulsed ac train for example
Figure 2CLPulsed ac train for example <\/td>\n<\/tr>\n
193<\/td>\n5.13.31 PULSED-DC
5.13.32 PULSED-DC-TRAIN <\/td>\n<\/tr>\n
194<\/td>\nFigure 21-Pulsed dc train for example
Figure 22-Pulsed dc train for example <\/td>\n<\/tr>\n
195<\/td>\n5.13.33 PULSED-DOPPLER
5.13.34 RADAR-SIGNAL <\/td>\n<\/tr>\n
196<\/td>\n5.13.35 W-SIGNAL
5.13.36 RANDOM-NOISE
5.13.37 RESOLVER <\/td>\n<\/tr>\n
197<\/td>\n5.13.38 ROTATION
Figure 23-Inertially (Earth) stabilized coordinate frame <\/td>\n<\/tr>\n
198<\/td>\nFigure 24WT referenced stabilized coordinate frame <\/td>\n<\/tr>\n
199<\/td>\nFigure 25Rotation quantity rate and acceleration illustration <\/td>\n<\/tr>\n
200<\/td>\nFigure 26-Upside-down missile UUT heading north <\/td>\n<\/tr>\n
201<\/td>\n5.13.39 SHORT
5.13.40 SQUARE-WAVE <\/td>\n<\/tr>\n
202<\/td>\n5.13.41 SW-SIGNAL
5.13.42 SUP-CAR-SIGNAL (Suppressed carrier signal) <\/td>\n<\/tr>\n
203<\/td>\n5.13.43 SYNCHRO
5.13.44 TACAN (Tactical air navigation) <\/td>\n<\/tr>\n
207<\/td>\n5.13.45 TIME-INTERVAL
5.13.46 TRIANGULAR-WAVE-SIGNAL
5.13.47 TURBINE-ENGINE-DATA <\/td>\n<\/tr>\n
208<\/td>\n5.13.48 VIBRATION <\/td>\n<\/tr>\n
209<\/td>\n5.13.49 VOR (VHF omnidirectional radio range) <\/td>\n<\/tr>\n
210<\/td>\n5.13.50 WAVEFORM <\/td>\n<\/tr>\n
211<\/td>\nFigure 27Definition of waveform period sample-time and sample-width <\/td>\n<\/tr>\n
212<\/td>\nFigure 28-Example waveform with voltage samples <\/td>\n<\/tr>\n
213<\/td>\n5.14 Noun modifiers
Figure 29-Voltage stepped and ramped waveforms <\/td>\n<\/tr>\n
215<\/td>\n5.14.1 Identifiers for pulse-type signals
5.14.2 Standard ATLAS noun modifiers <\/td>\n<\/tr>\n
216<\/td>\nFigure 30-Modifiers used with pulse-type signals <\/td>\n<\/tr>\n
220<\/td>\n5.14.3 Standard ATLAS noun modifier prefixes
5.14.4 Standard ATLAS noun modifier suffixes <\/td>\n<\/tr>\n
224<\/td>\nFigure 31Deak and peak-to-peak characteristics for voltage waveforms <\/td>\n<\/tr>\n
225<\/td>\nFigure 32-Instantaneous voltage characteristics <\/td>\n<\/tr>\n
227<\/td>\n5.14.5 Standard noun modifier enumeration values <\/td>\n<\/tr>\n
228<\/td>\n5.14.6 Modifier value descriptors <\/td>\n<\/tr>\n
229<\/td>\n5.14.7 Noun modifier definitions <\/td>\n<\/tr>\n
251<\/td>\nFigure 33Defmed voltage ranges for the example <\/td>\n<\/tr>\n
253<\/td>\n6.Conformance
6.1 Ada language capabilities
6.2 ABBET test pmedure language capabilities
6.3 Subsets and extensions
6.3.1 Supported nouns modifiers and connections <\/td>\n<\/tr>\n
259<\/td>\n6.3.2 Reusable higher-level test procedure components <\/td>\n<\/tr>\n
260<\/td>\n7.AdaPackages <\/td>\n<\/tr>\n
262<\/td>\n7.1 ATLAS-TYPES package specification <\/td>\n<\/tr>\n
271<\/td>\n7.2 NOUN-MODIFIER-TYPES package specification <\/td>\n<\/tr>\n
278<\/td>\n7.3 SIGNAL-DESCRIPTION package specification <\/td>\n<\/tr>\n
287<\/td>\n7.4 RESOURCE-DESCRIPTION package specification <\/td>\n<\/tr>\n
290<\/td>\n7.5 EVENT-DESCRIPTION package specification <\/td>\n<\/tr>\n
292<\/td>\n7.6 DIGITAL-DESCRIPTION package specification <\/td>\n<\/tr>\n
298<\/td>\n7.7 PATH-DESCRIPTION package specification <\/td>\n<\/tr>\n
301<\/td>\n7.8 SYNCHRONIZATION-TYPES package specification <\/td>\n<\/tr>\n
306<\/td>\n7.9 ATLAS-NOUNS-MODIFIERS-AND-CONNECTIONS package specification <\/td>\n<\/tr>\n
319<\/td>\n7.10 ANALOG-SENSOR-CAPABILITY package specification <\/td>\n<\/tr>\n
320<\/td>\n7.1 1 ANALOGSOURCE-CAPABILITY package specification <\/td>\n<\/tr>\n
321<\/td>\n7.12 SIMPLE-LOAD-CAPABILITY package specification <\/td>\n<\/tr>\n
322<\/td>\n7.13 TIME-INTERVAL-SENSOR_CAPABILITY package specification <\/td>\n<\/tr>\n
323<\/td>\n7.14 TIMER-SOURCE-CAPABILITY package specification <\/td>\n<\/tr>\n
324<\/td>\n7.15 ANALOG-SENSOR package specification <\/td>\n<\/tr>\n
327<\/td>\n7.16 ANALOG-SOURCE package specification <\/td>\n<\/tr>\n
329<\/td>\n7.17 SIMPLE-LOAD package specification <\/td>\n<\/tr>\n
331<\/td>\n7.18 Tm-INTERVAL-SENSOR package specification <\/td>\n<\/tr>\n
333<\/td>\n7.19 ANALOG-SIGNAL-MONiTOR-CAP&ILITY package specification <\/td>\n<\/tr>\n
334<\/td>\n7.20 ANALOG-TIME-MONITOR-CAPABILITY package specification
ANALOG-TIME-MONITOR-CAPABILITY <\/td>\n<\/tr>\n
335<\/td>\n7.21 MANUAL-INTERVENTION-CAPABILITY package specification
MANUAL-INTERVENTION-CAPABILITY <\/td>\n<\/tr>\n
336<\/td>\n7.22 ANALOG-SIGNAL-MONITOR package specification
ANALOG-SIGNAL-MONITOR <\/td>\n<\/tr>\n
337<\/td>\n7.23 ANALOG-TIME-MONITOR package specification
ANALOG-TIME-MONITOR <\/td>\n<\/tr>\n
338<\/td>\n7.24 MANUAL-INTERVENTION package specification
MANUAL-INTERVENTION <\/td>\n<\/tr>\n
339<\/td>\n7.25 DIGITAL-EVENT-MONITOR-CAPABILITY package specification <\/td>\n<\/tr>\n
340<\/td>\n7.26 DIGITAL-SENSOR-CAPABILITY package specification
DIGITAL-SENSOR-CAPABILITY <\/td>\n<\/tr>\n
341<\/td>\n7.27 DIGITAL-SOURCE-CAPABILITY package specification
DIGITAL-SOURCE-CAPABILITY <\/td>\n<\/tr>\n
342<\/td>\n7.28 DIGITAL-EVENT-MONITOR package specification
DIGITAL-EVENT-MONITOR <\/td>\n<\/tr>\n
343<\/td>\n7.29 DIGITAL-SENSOR package specification
DIGITAL-SENSOR <\/td>\n<\/tr>\n
345<\/td>\n7.30 DIGITAL-SOURCE package specification
DIGITAL-SOURCE <\/td>\n<\/tr>\n
346<\/td>\n7.31 TIMER-SOURCE package specification
TIMER-SOURCE <\/td>\n<\/tr>\n
347<\/td>\n7.32 SIMULTANEOUS-DIGITAL package specification
DO-SIMULTANEOUS <\/td>\n<\/tr>\n
348<\/td>\n7.33 DO-TIMED-DIGITAL package specifications
A set of DO-TIMED-DIGITAL packages <\/td>\n<\/tr>\n
353<\/td>\n7.34 DATABUS-DESCRIPTION package specification
DATA-BUS-DESCRIPTION <\/td>\n<\/tr>\n
363<\/td>\n7.35 EXCHANGE-DEFINITION package specification
EXCHANGE-DEFINITION <\/td>\n<\/tr>\n
365<\/td>\n7.37 ALTERNATE-DATA-BUS package specification
ALTERNATE-DATA-BUS <\/td>\n<\/tr>\n
366<\/td>\n7.38 DC-DATA-BUS-EXCHANGE package specification <\/td>\n<\/tr>\n
367<\/td>\n7.39 ABBET-EVALUATIONS package specification <\/td>\n<\/tr>\n
369<\/td>\n7.40 VIRTU&-RESOURCE-GROVP package specification <\/td>\n<\/tr>\n
370<\/td>\n7.41 ABBET-TEST-CAPSULE package specification
ABBET-TEST-CAPSULE <\/td>\n<\/tr>\n
371<\/td>\n7.42 ATLAS-CONTROL package specification <\/td>\n<\/tr>\n
372<\/td>\nAnnex A Test program examples <\/td>\n<\/tr>\n
373<\/td>\nA.l Supported NOUNS-MODIFIERS-AND-CONNECTIONS package specification <\/td>\n<\/tr>\n
378<\/td>\nA.2 ALTPI analog TPS example <\/td>\n<\/tr>\n
379<\/td>\nA.2.1 ANALOG-TEST-OTHER-UNITS package <\/td>\n<\/tr>\n
380<\/td>\nA.2.2 TEST-CONNECTIONS package <\/td>\n<\/tr>\n
382<\/td>\nA.2.3 ANALOG-TEsT-CAPABILITIES package <\/td>\n<\/tr>\n
384<\/td>\nA.2.4 ANALOG-TEST-RESOURCES package <\/td>\n<\/tr>\n
387<\/td>\nA.2.6 ANALOG-TEST Procedure <\/td>\n<\/tr>\n
389<\/td>\nA.2.7 ANALOG-TEST-CAPSULE package <\/td>\n<\/tr>\n
391<\/td>\nA.2.8 CAPSULE-EXECUTION Procedure <\/td>\n<\/tr>\n
392<\/td>\nA.3 ALTPI Digital TPS Example
A.3.1 XMITRCV package <\/td>\n<\/tr>\n
396<\/td>\nA.4 ALTPI noun modifier extension TPS example
A.4.1 VACSENCP package
A.4.2 VACUUT package <\/td>\n<\/tr>\n
397<\/td>\nA.4.3 VACTEST package <\/td>\n<\/tr>\n
398<\/td>\nATE device-todevice connection extension example <\/td>\n<\/tr>\n
400<\/td>\nAnnex B Standard package file organization <\/td>\n<\/tr>\n
402<\/td>\nIndex to ABBET Ada identitiers <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1994<\/td>\n426<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":79921,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-79920","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/79920","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/79921"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=79920"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=79920"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=79920"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}