{"id":457655,"date":"2024-10-20T09:52:30","date_gmt":"2024-10-20T09:52:30","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61189-2-7202024\/"},"modified":"2024-10-26T18:21:07","modified_gmt":"2024-10-26T18:21:07","slug":"bs-en-iec-61189-2-7202024","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61189-2-7202024\/","title":{"rendered":"BS EN IEC 61189-2-720:2024"},"content":{"rendered":"
IEC 61189-2-720:2024 provides a method to evaluate specific characteristics of circuit boards by measuring the capacitance between conductor traces and a ground plane and can be used for qualitative comparison of a test specimen to a reference board. This method is not intended for quantitative measurements and for assessment of conformity to a specification.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Objective <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5 Test specimen 6 Test method Figures Figure 1 \u2013 Capacitance difference depending on the defect of mouse bite Figure 2 \u2013 Test specimen <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 7 Test procedures Figure 3 \u2013 Schematic of the capacitance test method <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 8 Report Table 1 \u2013 Definition of uppercase <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Annex A (informative)The capacitive test method A.1 Test schematic A.2 Test result Figure A.1 \u2013 Test schematic <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Table A.1 \u2013 Test result for the test specimen <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Test methods for electrical materials, circuit boards and other interconnection structures and assemblies – Detection of defects in interconnection structures by measurement of capacitance<\/b><\/p>\n |