{"id":445452,"date":"2024-10-20T08:41:53","date_gmt":"2024-10-20T08:41:53","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-iec-23837-22023\/"},"modified":"2024-10-26T16:11:05","modified_gmt":"2024-10-26T16:11:05","slug":"bs-iso-iec-23837-22023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-iec-23837-22023\/","title":{"rendered":"BS ISO\/IEC 23837-2:2023"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
8<\/td>\nForeword <\/td>\n<\/tr>\n
9<\/td>\nIntroduction <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
13<\/td>\n4 Abbreviated terms <\/td>\n<\/tr>\n
14<\/td>\n5 Overview of the evaluation method for QKD modules
5.1 General
5.2 Scope of the evaluation method <\/td>\n<\/tr>\n
15<\/td>\n5.3 Overview of evaluation activities for SFRs
5.3.1 General <\/td>\n<\/tr>\n
16<\/td>\n5.3.2 EAs for SFRs FTP_QKD.1 and FTP_QKD.2
5.3.3 EAs for SFRs on quantum optical components and parameter adjustment procedure(s) <\/td>\n<\/tr>\n
17<\/td>\n5.3.4 EAs for SFRs on conventional network components
5.3.5 Thresholds and input parameters related to the evaluation activities <\/td>\n<\/tr>\n
18<\/td>\n5.4 Overview of evaluation activities for SARs
6 EAs for the evaluation of FTP_QKD
6.1 General <\/td>\n<\/tr>\n
20<\/td>\n6.2 EA to test quantum state transmission and sifting procedures
6.2.1 General aspects <\/td>\n<\/tr>\n
22<\/td>\n6.2.2 Test procedure <\/td>\n<\/tr>\n
24<\/td>\n6.2.3 Pass\/fail criteria
6.3 EA to test other post-processing procedures
6.3.1 General aspects <\/td>\n<\/tr>\n
26<\/td>\n6.3.2 Test procedure <\/td>\n<\/tr>\n
27<\/td>\n6.3.3 Pass\/fail criteria
6.4 EA to test parameter adjustment procedure(s)
6.4.1 General aspects <\/td>\n<\/tr>\n
29<\/td>\n6.4.2 Test procedure
6.4.3 Pass\/fail criteria
7 EAs for evaluating quantum optical components in the transmitter module
7.1 General <\/td>\n<\/tr>\n
32<\/td>\n7.2 EA to test the photon-number distribution of optical pulses
7.2.1 General aspects <\/td>\n<\/tr>\n
34<\/td>\n7.2.2 Test procedure <\/td>\n<\/tr>\n
35<\/td>\n7.2.3 Pass\/fail criteria
7.3 EA to test the mean photon number and stability of optical pulses
7.3.1 General aspects <\/td>\n<\/tr>\n
36<\/td>\n7.3.2 Test procedure <\/td>\n<\/tr>\n
38<\/td>\n7.3.3 Pass\/fail criteria
7.4 EA to test the independence of the intensities of optical pulses
7.4.1 General aspects <\/td>\n<\/tr>\n
39<\/td>\n7.4.2 Test procedure <\/td>\n<\/tr>\n
40<\/td>\n7.4.3 Pass\/fail criteria
7.5 EA to test the accuracy of state encoding
7.5.1 General aspects <\/td>\n<\/tr>\n
41<\/td>\n7.5.2 Test procedure <\/td>\n<\/tr>\n
42<\/td>\n7.5.3 Pass\/fail criteria
7.6 EA to test the indistinguishability of encoded states
7.6.1 General aspects <\/td>\n<\/tr>\n
44<\/td>\n7.6.2 Test procedure <\/td>\n<\/tr>\n
45<\/td>\n7.6.3 Pass\/fail criteria <\/td>\n<\/tr>\n
46<\/td>\n7.7 EA to test the uniform distribution of the global phase of optical pulses
7.7.1 General aspects <\/td>\n<\/tr>\n
47<\/td>\n7.7.2 Test procedure <\/td>\n<\/tr>\n
48<\/td>\n7.7.3 Pass\/fail criteria
7.8 EA to test the degree of optical isolation of the TX module
7.8.1 General aspects <\/td>\n<\/tr>\n
50<\/td>\n7.8.2 Test procedure
7.8.3 Pass\/fail criteria
7.9 EA to test the sensitivity of the injected light monitor in the TX module
7.9.1 General aspects <\/td>\n<\/tr>\n
51<\/td>\n7.9.2 Test procedure <\/td>\n<\/tr>\n
52<\/td>\n7.9.3 Pass\/fail criteria
7.10 EA to test the robustness of the TX module against laser injection
7.10.1 General aspects <\/td>\n<\/tr>\n
54<\/td>\n7.10.2 Test procedure <\/td>\n<\/tr>\n
56<\/td>\n7.10.3 Pass\/fail criteria <\/td>\n<\/tr>\n
57<\/td>\n8 EAs for the evaluation of quantum optical components in the receiver module
8.1 General <\/td>\n<\/tr>\n
59<\/td>\n8.2 EA to test the consistency of detection probability in the RX module
8.2.1 General aspects <\/td>\n<\/tr>\n
61<\/td>\n8.2.2 Test procedure
8.2.3 Pass\/fail criteria <\/td>\n<\/tr>\n
62<\/td>\n8.3 EA to test information leakage of back-flashes from the RX module
8.3.1 General aspects <\/td>\n<\/tr>\n
63<\/td>\n8.3.2 Test procedure <\/td>\n<\/tr>\n
64<\/td>\n8.3.3 Pass\/fail criteria
8.4 EA to test the degree of optical isolation of the RX module
8.4.1 General aspects <\/td>\n<\/tr>\n
65<\/td>\n8.4.2 Test procedure
8.4.3 Pass\/fail criteria <\/td>\n<\/tr>\n
66<\/td>\n8.5 EA to test the sensitivity of the injected light monitor in the RX module
8.5.1 General aspects <\/td>\n<\/tr>\n
67<\/td>\n8.5.2 Test procedure
8.5.3 Pass\/fail criteria <\/td>\n<\/tr>\n
68<\/td>\n8.6 EA to test the robustness of the RX module against bright light blinding
8.6.1 General aspects <\/td>\n<\/tr>\n
69<\/td>\n8.6.2 Test procedure <\/td>\n<\/tr>\n
70<\/td>\n8.6.3 Pass\/fail criteria
8.7 EA to test the appropriateness of dead time settings of SPDs
8.7.1 General aspect <\/td>\n<\/tr>\n
71<\/td>\n8.7.2 Test procedure <\/td>\n<\/tr>\n
72<\/td>\n8.7.3 Pass\/fail criteria
8.8 EA to test the temporal profile of the detection efficiency for SPDs
8.8.1 General aspects <\/td>\n<\/tr>\n
73<\/td>\n8.8.2 Test procedure
8.8.3 Pass\/fail criteria <\/td>\n<\/tr>\n
74<\/td>\n8.9 EA to test the robustness of the RX module against laser injection
8.9.1 General aspects <\/td>\n<\/tr>\n
75<\/td>\n8.9.2 Test procedure <\/td>\n<\/tr>\n
76<\/td>\n8.9.3 Pass\/fail criteria <\/td>\n<\/tr>\n
77<\/td>\n8.10 EA to test the detection limits of homodyne detectors in the RX module
8.10.1 General aspects
8.10.2 Test procedure <\/td>\n<\/tr>\n
78<\/td>\n8.10.3 Pass\/fail criteria
8.11 EA to test the appropriateness of double-click event handling
8.11.1 General aspects <\/td>\n<\/tr>\n
79<\/td>\n8.11.2 Test procedure
8.11.3 Pass\/fail criteria
9 EAs for the evaluation of parameter adjustment procedure(s)
9.1 General <\/td>\n<\/tr>\n
80<\/td>\n9.2 EA to test the inducibility of detection probability mismatch
9.2.1 General aspects <\/td>\n<\/tr>\n
83<\/td>\n9.2.2 Test procedure <\/td>\n<\/tr>\n
84<\/td>\n9.2.3 Pass\/fail criteria
9.3 EA to test the correctness of shot noise alignment
9.3.1 General aspects <\/td>\n<\/tr>\n
85<\/td>\n9.3.2 Test procedure <\/td>\n<\/tr>\n
87<\/td>\n9.3.3 Pass\/fail criteria
10 Supplementary activities for the evaluation of SFRs on conventional network components
10.1 General <\/td>\n<\/tr>\n
88<\/td>\n10.2 \u200bEvaluation activities for FCS related SFRs overview
10.3 \u200bEvaluation activities for other SFRs overview
11 Supplementary activities for SARs
11.1 General
11.2 Supplementary activities for Class APE: Protection Profile evaluation <\/td>\n<\/tr>\n
90<\/td>\n11.3 Supplementary activities for Class ASE: Security Target evaluation
11.4 Supplementary activities for Class ADV: Development
11.4.1 Supplementary activities for ADV_ARC <\/td>\n<\/tr>\n
91<\/td>\n11.4.2 Supplementary activities for ADV_FSP <\/td>\n<\/tr>\n
92<\/td>\n11.5 Supplementary activities for Class AGD: Guidance documents
11.5.1 Supplementary activities for AGD_OPE <\/td>\n<\/tr>\n
93<\/td>\n11.5.2 Supplementary activities for AGD_PRE
11.6 Supplementary activities for Class ATE: Test
11.6.1 Supplementary activities for ATE_FUN <\/td>\n<\/tr>\n
94<\/td>\n11.6.2 Supplementary activities for ATE_IND <\/td>\n<\/tr>\n
95<\/td>\n11.7 Supplementary activities for Class AVA: Vulnerability assessment <\/td>\n<\/tr>\n
98<\/td>\n12 Conformance statement
12.1 General
12.2 Conformance statement specific to evaluation activities for SFRs <\/td>\n<\/tr>\n
99<\/td>\n12.3 Conformance statement specific to EAs for SARs <\/td>\n<\/tr>\n
100<\/td>\nAnnex A (informative) Guidance on the calculation of attack potential for the evaluation of QKD modules <\/td>\n<\/tr>\n
107<\/td>\nAnnex B (informative) Rating examples for AVA attack potential computation <\/td>\n<\/tr>\n
110<\/td>\nAnnex C (informative) Thresholds collection <\/td>\n<\/tr>\n
114<\/td>\nAnnex D (informative) Correspondence between EAs and known attacks to quantum optical components and parameter adjustment procedure(s) of QKD modules <\/td>\n<\/tr>\n
116<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Information security. Security requirements, test and evaluation methods for quantum key distribution – Evaluation and testing methods<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2023<\/td>\n118<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":445461,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-445452","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/445452","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/445461"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=445452"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=445452"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=445452"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}