{"id":421478,"date":"2024-10-20T06:36:26","date_gmt":"2024-10-20T06:36:26","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-197492021-3\/"},"modified":"2024-10-26T12:22:00","modified_gmt":"2024-10-26T12:22:00","slug":"bs-iso-197492021-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-197492021-3\/","title":{"rendered":"BS ISO 19749:2021"},"content":{"rendered":"

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.<\/p>\n

\n

NOTE 1 This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.<\/p>\n<\/blockquote>\n

\n

NOTE 2 This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.<\/p>\n<\/blockquote>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
7<\/td>\nForeword <\/td>\n<\/tr>\n
8<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references <\/td>\n<\/tr>\n
10<\/td>\n3 Terms and definitions
3.1 General terms <\/td>\n<\/tr>\n
12<\/td>\n3.2 Core terms: image analysis
3.3 Core terms: statistical symbols and definitions <\/td>\n<\/tr>\n
14<\/td>\n3.4 Core terms: measurands and descriptors <\/td>\n<\/tr>\n
16<\/td>\n3.5 Core terms: metrology <\/td>\n<\/tr>\n
18<\/td>\n3.6 Core terms: scanning electron microscopy <\/td>\n<\/tr>\n
19<\/td>\n4 General principles
4.1 SEM imaging <\/td>\n<\/tr>\n
20<\/td>\n4.2 SEM image-based particle size measurements <\/td>\n<\/tr>\n
21<\/td>\n4.3 SEM image-based particle shape measurements
5 Sample preparation
5.1 Sample preparation fundamental information <\/td>\n<\/tr>\n
22<\/td>\n5.2 General recommendations
5.3 Ensuring good sampling of powder or dispersion-in-liquid raw materials
5.3.1 Powders <\/td>\n<\/tr>\n
23<\/td>\n5.3.2 Nanoparticle dispersions in liquids
5.4 Ensuring representative dispersion
5.5 Nanoparticle deposition on a substrate
5.5.1 General <\/td>\n<\/tr>\n
24<\/td>\n5.5.2 Nanoparticle deposition on wafers and chips of silicon or other materials <\/td>\n<\/tr>\n
25<\/td>\n5.5.3 Nanoparticle deposition on TEM grids <\/td>\n<\/tr>\n
26<\/td>\n5.6 Number of samples to be prepared
5.7 Number of particles to be measured for particle size determination <\/td>\n<\/tr>\n
27<\/td>\n5.8 Number of particles to be measured for particle shape determination
6 Qualification of the SEM for nanoparticle measurements
7 Image acquisition
7.1 General <\/td>\n<\/tr>\n
31<\/td>\n7.2 Setting suitable image magnification and pixel resolution <\/td>\n<\/tr>\n
32<\/td>\n8 Particle analysis
8.1 Particle analysis fundamental information <\/td>\n<\/tr>\n
33<\/td>\n8.2 Individual particle analysis
8.3 Automated particle analysis <\/td>\n<\/tr>\n
34<\/td>\n8.4 Automated particle analysis procedure example <\/td>\n<\/tr>\n
35<\/td>\n9 Data analysis
9.1 General
9.2 Raw data screening: detecting touching particles, artefacts and contaminants
9.3 Fitting models to data
9.4 Assessment of measurement uncertainty
9.4.1 General <\/td>\n<\/tr>\n
36<\/td>\n9.4.2 Example: Measurement uncertainty for particle size measurements <\/td>\n<\/tr>\n
37<\/td>\n9.4.3 Bivariate analysis
10 Reporting the results <\/td>\n<\/tr>\n
39<\/td>\nAnnex A (normative) Qualification of the SEM for nanoparticle measurements <\/td>\n<\/tr>\n
44<\/td>\nAnnex B (informative) Cross-sectional titanium dioxide samples preparation <\/td>\n<\/tr>\n
46<\/td>\nAnnex C (informative) Case study on well-dispersed 60 nm size silicon dioxide nanoparticles <\/td>\n<\/tr>\n
54<\/td>\nAnnex D (informative) Case study on 40 nm size titanium dioxide nanoparticles <\/td>\n<\/tr>\n
63<\/td>\nAnnex E (informative) Example for extracting particle size results of SEM-based nanoparticle measurements using ImageJ <\/td>\n<\/tr>\n
65<\/td>\nAnnex F (informative) Effects of some image acquisition parameters and thresholding methods on SEM particle size measurements <\/td>\n<\/tr>\n
69<\/td>\nAnnex G (informative) Example for reporting results of SEM-based nanoparticle measurements <\/td>\n<\/tr>\n
79<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2021<\/td>\n80<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":421489,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-421478","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/421478","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/421489"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=421478"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=421478"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=421478"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}