This part of IEC 62631 specifies test methods for the determination of permittivity and dissipation factor properties of solid insulating materials in a high frequency range from 1 MHz to 300 MHz.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 4 Methods of test 4.1 Basic theory <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figures Figure 1 \u2013 Dielectric dissipation factor <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | Figure 2 \u2013 Equivalent circuit diagrams with capacitive test specimen <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4.2 Distinctive factors for the measurement in high frequency range Figure 3 \u2013 Equivalent parallel circuit for test fixture with sample and leads to equipment <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.3 Power supply 4.4 Equipment 4.4.1 Accuracy <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4.4.2 Distinctive feature of equipment for measurement in high frequency range <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 4.4.3 Choice of measurement methods Figure 4 \u2013 Existence of residual impedance andstray capacitance in directly connected system <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 4.5 Calibration 4.6 Test specimen 4.6.1 General 4.6.2 Recommended dimensions of test specimen and electrode arrangements 4.6.3 Number of test specimens 4.6.4 Conditioning and pre-treatment of test specimen Table 1 \u2013 Applicable frequency range in effective apparatus <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 4.7 Procedures for specific materials 5 Test procedure 5.1 General 5.2 Calculation of permittivity and relative permittivity 5.2.1 Relative permittivity 5.2.2 Dielectric dissipation factor tan \u03b4 6 Report <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 7 Repeatability and reproducibility <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Annex A (informative)Compensation method using a series circuit Figure A.1 \u2013 Compensation method using a series circuit <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Annex B (informative)Parallel electrodes with shield ring Figure B.1 \u2013 Configuration of parallel electrode with shield ring <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Annex C (informative)Apparatus C.1 Parallel T network bridge Figure C.1 \u2013 Parallel T network, principal circuit diagram Figure C.2 \u2013 Parallel T network, practical circuit diagram <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | C.2 Resonance method <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Figure C.3 \u2013 Principle of resonance method, circuit diagram(originally from Q meter) <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | C.3 I-V method designed for high frequencies C.4 Auto-balancing bridge method <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | Figure C.4 \u2013 Auto-balancing circuit <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | Annex D (informative)Non-contacting electrode method withmicrometer-controlled parallel electrodes in air <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure D.1 \u2013 Non-contacting electrode method <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Dielectric and resistive properties of solid insulating materials – Relative permittivity and dissipation factor. High frequencies (1 MHz to 300 MHz). AC methods<\/b><\/p>\n |