This part of ISO 3262 specifies the requirements and the corresponding methods of test for natural quartz (ground).<\/p>\n
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| 3<\/td>\n | TitlePage – Surface chemical analysis\ufffd\u2014 Secondary- ion mass spectrometry\ufffd\u2014 Method for estimating … <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | TableofContent – Contents Page <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | Foreword – Foreword <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | Introduction – Introduction <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | Scope – 1\ufffd\ufffd\ufffd Scope UntitledSubclause2 – 1.1\ufffd\ufffd\ufffd This International Standard UntitledSubclause2 – 1.2\ufffd\ufffd\ufffd This International Standard NormativeReference – 2\ufffd\ufffd\ufffd Normative references Clause1 – 3\ufffd\ufffd\ufffd Symbols Clause1 – 4\ufffd\ufffd\ufffd Requirements for multiple delta-layer reference materials UntitledSubclause2 – 4.1\ufffd\ufffd\ufffd Ideal delta-layers have single atomic layer thickness according to th… UntitledSubclause2 – 4.2\ufffd\ufffd\ufffd The matrix of sputtered surface layers shall not change during SIMS d… <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | UntitledSubclause2 – 4.3\ufffd\ufffd\ufffd The surface and the delta-layers shall be flat and parallel to each o… UntitledSubclause2 – 4.4\ufffd\ufffd\ufffd The thickness of the doped delta-layers shall be sufficiently less th… UntitledSubclause2 – 4.5\ufffd\ufffd\ufffd The spacing between adjacent delta-layers shall be large enough so th… UntitledSubclause2 – 4.6\ufffd\ufffd\ufffd The thickness, the position and the interface roughness of the delta-… Clause1 – 5\ufffd\ufffd\ufffd Procedures UntitledSubclause2 – 5.1\ufffd\ufffd\ufffd For adjustment and optimization of the secondary-ion mass spectromete… UntitledSubclause2 – 5.2\ufffd\ufffd\ufffd For the use of UntitledSubclause2 – 5.3\ufffd\ufffd\ufffd Before estimating the SIMS depth resolution parameters, if the backgr… <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | UntitledSubclause2 – 5.4\ufffd\ufffd\ufffd To estimate the decay lengths and the Gaussian broadening, non-linear… Clause1 – 6\ufffd\ufffd\ufffd Test report <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | AnnexNormative – Simpler options of estimating SIMS depth resolution parameters Clause1 – A.1\ufffd\ufffd\ufffd General Clause1 – A.2\ufffd\ufffd\ufffd Procedure <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | Bibliography – Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials<\/b><\/p>\n |