{"id":207939,"date":"2024-10-19T13:23:54","date_gmt":"2024-10-19T13:23:54","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-f676-2003\/"},"modified":"2024-10-25T06:06:04","modified_gmt":"2024-10-25T06:06:04","slug":"astm-f676-2003","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-f676-2003\/","title":{"rendered":"ASTM-F676 2003"},"content":{"rendered":"<h3>ASTM F676-97-Reapproved2003<\/h3>\n<h4>Withdrawn Standard: Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)<\/h4>\n<div>\n<h4>ASTM F676<\/h4>\n<p><strong>Scope<\/strong><\/p>\n<p>1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.<\/p>\n<p>1.2 <i>Units<\/i>\u2014The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.<\/p>\n<p>1.3 <i>This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/i><\/p>\n<p><strong>Keywords<\/strong><\/p>\n<p>hardness assurance; neutron degradation; sink current; transistor-transistor logic (TTL)<\/p>\n<p><strong>ICS Code<\/strong><\/p>\n<p>ICS Number Code n\/a<\/p>\n<p><strong>DOI:<\/strong> 10.1520\/F0676-97R03<\/p>\n<\/div>\n<h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>1<b><\/td>\n<td>Scope <br \/> Referenced Documents <br \/> Summary of Test Method <br \/> Significance and Use <br \/> Interferences <br \/> Apparatus  <\/td>\n<\/tr>\n<tr>\n<td><b>2<b><\/td>\n<td>Sampling <br \/> Procedure <br \/> FIG. 1   <\/td>\n<\/tr>\n<tr>\n<td><b>3<b><\/td>\n<td>Report <br \/> Precision and Bias <br \/> Keywords <br \/> TABLE 1  <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>F676-97(2003) Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/astm\/\"><b>ASTM<\/b><\/a><\/td>\n<td>2003<\/td>\n<td>3<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":207941,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2637],"product_tag":[],"class_list":{"0":"post-207939","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-astm","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/207939","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/207941"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=207939"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=207939"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=207939"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}