{"id":123696,"date":"2024-10-19T04:49:07","date_gmt":"2024-10-19T04:49:07","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-f1996-2\/"},"modified":"2024-10-24T23:06:39","modified_gmt":"2024-10-24T23:06:39","slug":"astm-f1996-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-f1996-2\/","title":{"rendered":"ASTM-F1996"},"content":{"rendered":"<\/p>\n
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.<\/p>\n
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | Scope Referenced Documents Terminology Significance and Use Interferences Apparatus Procedure <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Report Keywords FIG. 1 <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" F1996-06 Standard Test Method for Silver Migration for Membrane Switch Circuitry<\/b><\/p>\n |