IEEE C62.36-1991

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IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

Published By	Publication Date	Number of Pages
IEEE	1991	34

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Description

New IEEE Standard – Superseded. Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.

PDF Catalog

PDF Pages	PDF Title
6	4.3 Radiation Basic Configurations Basic Configurations
7	1 Scope 2 Definitions 3 References
8	Service Conditions 4.1 Normal Service Conditions 4.1.1 Environmental Conditions 4.1.2 Physical Properties 4.1.3 System Conditions Surge Rating of the Surge Protector Under System Conditions Unusual Service Conditions 4.2.1 Environmental Conditions 4.2.2 Physical Conditions 4.2.3 System Conditions
10	Standard Design Test Procedure Standard Design Test Criteria 6.2 Statistical Procedures 6.3 Test Conditions Nonsurge Performance Tests Rated Voltage Test Rated Current Test
11	DC Series Resistance Test Test Circuits for the Rated Voltage Test
12	Standby Current and Insulation Resistance Test Test Circuits for the Rated Current Test
13	Test Circuits for the Analog Insertion Loss Test Fig 4a Test Circuit Before Insertion of Surge Protector Fig 4b Test Circuits After Insertion of Surge Protector
14	7.5 Capacitance Test 7.6 Inductance Test Analog Insertion Loss Test Phase Shift Test Return Loss Test
15	Longitudinal Balance Test Test Circuits for the Phase Shift Test
16	Test Circuit for the Return Loss Test Fig 6a Circuit Without Surge Protector Circuit With Surge Protector
17	Digital Insertion Loss Test Decay-Time Test
18	Rise- and Decay-Time Test Bit Error Rate (BER) Test
19	Test Circuits for the Bit Error Rate (BER) Test
20	Active Performance Tests 8.1 DC-Limiting-Voltage Test 8.2 Impulse-Limiting-Voltage Test Test Circuit for the DC-Limiting-Voltage Test
21	Using Fig Using Fig Voltage Test
22	Test Circuits for the Impulse-Limiting-Voltage Test
23	Transition Current Test Impulse-Limiting-Voltage Test Waveform
24	Test Circuits for the Transition Current Test
25	8.4 Current-Response-Time Test Test Circuits for the Current-Response-Time Test
26	Impulse Reset Test Test Circuits of Fig
27	Test Circuits for the Impulse Reset Test
28	Current Reset Test AC Life Test
29	Test Circuits for the Current Reset Test
30	Impulse Life Test Test Circuits for the AC Life Test Examples of Parameters for the AC Life Test
31	Maximum Single-Impulse Discharge Test Between Impulses for the Impulse Life Test Standard Terminal Combinations for the Impulse Life Test
32	Failure Modes Discharge Test
33	Appendix
34	Possible Internal Arrangement of Station Protector Components

Additional information

Standard Title	IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Published Code	IEEE
Publication Date	1991
Pages Count	34

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IEEE C62.36-1991

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