IEEE 1650-2005
$62.29
IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes
| Published By | Publication Date | Number of Pages |
| IEEE | 2005 | 25 |
New IEEE Standard – Inactive-Reserved. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1650 Front Cover |
| 3 | IEEE Standard Test Methods for |
| 6 | Introduction Notice to users Errata Interpretations Patents |
| 7 | Participants |
| 9 | Contents |
| 11 | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Electrical characterization overview |
| 16 | 2. Definitions, acronyms, and abbreviations 2.1 Definitions |
| 17 | 2.2 Acronyms and abbreviations 3. Nanotube properties |
| 18 | 3.1 Single-walled nanotube |
| 19 | 3.2 Multi-walled nanotube 4. Electrodes 4.1 Materials 4.2 Method for electrode fabrication |
| 20 | 4.3 Dimensions 5. Device characterization 5.1 Architecture design 5.2 Method for processing and fabrication |
| 21 | 5.3 Standard characterization procedures |
| 24 | 5.4 Environmental control and standards |
| 25 | Annex A (informative) Bibliography |
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