IEEE 1193 2004
$44.96
IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators
Published By | Publication Date | Number of Pages |
IEEE | 2004 | 81 |
Revision Standard – Active. Standard frequency generators that include all atomic frequency standards and precision quartz crystal oscillators are addressed.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEEE Std 1193-2003 Cover |
2 | Title Page |
4 | Introduction Participants |
6 | CONTENTS |
8 | 1. Overview 1.1 Scope 1.2 Purpose |
9 | 1.3 Summary 1.3.1 General considerations in the metrology of environmental sensitivities (refer to Clause 3) 1.3.2 Acceleration effects (refer to Clause 4) 1.3.3 Temperature, humidity, and pressure (refer to Clause 5) |
10 | 1.3.4 Electric and magnetic fields 1.3.5 Ionizing and particle radiation (refer to Clause 7) 1.3.6 Aging, warm-up time, and retrace (refer to Clause 8) 2. References |
11 | 3. General considerations in the metrology of environmental sensitivities and relativistic effects 3.1 General 3.2 Analytical methods |
14 | 3.3 Measurement methods |
16 | 3.4 Interactions among environmental stimuli |
18 | 3.5 Error budgets |
20 | 3.6 Transient effects and aging |
22 | 3.7 Additional considerations 3.7.1 Relativistic effects on clocks 3.7.2 Testing microprocessor-driven clocks |
23 | 4. Acceleration effects 4.1 Description of the phenomena |
25 | 4.2 Effects and test methods 4.2.1 Quasi-static acceleration |
27 | 4.2.2 Vibration effects |
30 | 4.2.3 Shock |
31 | 4.3 Other effects 4.3.1 Frequency multiplication 4.3.2 Large modulation index 4.3.3 Two-sample deviation |
32 | 4.3.4 Integrated phase noise, phase excursions, jitter, and wander |
33 | 4.3.5 Spectral responses at other than the vibration frequency 4.3.6 Acceleration effects on crystal filters |
34 | 4.4 Special user notes 4.4.1 Interactions with other environmental effects and other pitfalls |
35 | 4.4.2 Safety issues |
36 | 5. Temperature, humidity, and pressure 5.1 Description of the phenomena |
37 | 5.2 Effects and test methods 5.2.1 Effects of temperature, humidity, and pressure (THP) |
39 | 5.2.2 Test methods for temperature, humidity, and pressure |
40 | 5.2.3 Guidelines for documenting results 5.3 Special user notes 5.3.1 Device positioning |
41 | 5.3.2 Temperature gradients 5.3.3 Sealed devices 5.3.4 Quartz crystals |
42 | 5.3.5 Rubidium devices 5.3.6 Cesium beam devices |
43 | 5.3.7 Hydrogen masers 5.3.8 Frequency drift and THP 5.3.9 Some pitfalls |
44 | 6. Electric and magnetic field effects 6.1 Description of the phenomena 6.1.1 Electric field effects 6.1.2 Magnetic field effects 6.1.3 Electromagnetic interface (EMI) effects 6.2 Effects and test methods 6.2.1 Electric fields |
45 | 6.2.2 Magnetic fields |
47 | 6.2.3 Electromagnetic interference |
49 | 6.3 Some pitfalls 7. Ionizing and particle radiation 7.1 Description of the phenomena 7.1.1 General discussion 7.1.2 Previous investigations |
50 | 7.2 Effects and test methods 7.2.1 Total dose due to ionization |
52 | 7.2.2 High dose rate environments 7.2.3 Electromagnetic pulse (EMP) effects |
55 | 7.3 Special user notes 7.3.1 Response of frequency standards to radiation |
56 | 7.3.2 Test procedures |
58 | 7.3.3 Radiation test facilities |
60 | 7.3.4 Single event phenomena |
61 | 8. Aging, warm-up time, and retrace 8.1 Description of the phenomena 8.1.1 Aging |
62 | 8.1.2 Warm-up time |
63 | 8.1.3 Retrace 8.2 Effects and test methods 8.2.1 Aging |
64 | 8.2.2 Warm-up time (Twu) |
65 | 8.2.3 Retrace |
66 | 8.3 Special user notes 8.3.1 Drift vs aging 8.3.2 Crystal oscillators 8.3.3 Rubidium frequency standards |
67 | 8.3.4 Rubidium-crystal oscillators 8.3.5 Hydrogen masers 8.3.6 Cesium-beam frequency standards |
68 | Annex A – (informative) Bibliography A.1 General considerations in the metrology of environmental sensitivities (Clause 3) |
71 | A.2 Acceleration effects (Clause 4) |
73 | A.3 Temperature, humidity, and pressure (Clause 5) |
74 | A.4 Electric and magnetic fields (Clause 6) A.5 Ionizing and particle radiation (Clause 7) |
76 | A.6 Aging, warm-up time, and retrace (Clause 8) |