IEC 62047-35:2019
$43.55
Dispositifs à semiconducteurs – Dispositifs micro électromécaniques – Partie 35: Méthode d’essai des caractéristiques électriques sous déformation par courbure de dispositifs électromécaniques souples
| Published By | Publication Date | Number of Pages |
| IEC | 2019-11-22 | 46 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2019-11-22 |
| Pages Count | 46 |
| Language | France |
| Edition | 1.0 |
| File Size | 2.4 MB |
| ICS Codes | 31.080.99 - Other semiconductor devices |
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