IEC 60749-4:2017
$13.65
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 4: Essai continu fortement accéléré de contrainte de chaleur humide (HAST)
| Published By | Publication Date | Number of Pages |
| IEC | 2017-03-03 | 24 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2017-03-03 |
| Pages Count | 24 |
| Language | France |
| Edition | 2.0 |
| File Size | 1.2 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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