BSI PD ISO/TR 23173:2021
$198.66
Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
| Published By | Publication Date | Number of Pages |
| BSI | 2021 | 58 |
This document provides a description of methods by which the coating thickness and chemical composition of “core-shell” nanoparticles (including some variant and non-ideal morphologies) can be determined using electron spectroscopy techniques. It identifies the assumptions, challenges, and uncertainties associated with each method. It also describes protocols and issues for the general analysis of nanoparticle samples using electron spectroscopies, specifically in relation to their importance for measurements of coating thicknesses.
This document focuses on the use of electron spectroscopy techniques, specifically X-ray photoelectron spectroscopy, Auger electron spectroscopy, and synchrotron-based methods. These cannot provide all of the information necessary for accurate analysis and therefore some additional analytical methods are outlined in the context of their ability to aid in the interpretation of electron spectroscopy data.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions 4 Symbols and abbreviated terms |
| 11 | 5 Overview |
| 12 | 6 X-ray photoelectron spectroscopy 6.1 General 6.2 Coating thickness measurement |
| 13 | 6.3 Nanoparticle coating thickness |
| 14 | 6.4 Numerical methods |
| 17 | 6.5 Descriptive formulae |
| 19 | 6.6 Modelling and simulation software |
| 20 | 6.7 Method comparisons |
| 23 | 6.8 Inelastic background analysis |
| 24 | 6.9 Elemental composition |
| 26 | 6.10 Variable excitation energy XPS 6.10.1 General |
| 27 | 6.10.2 Qualitative depth-profiling |
| 29 | 6.10.3 Quantitative depth-profiling |
| 30 | 6.11 Near-ambient-pressure XPS (NAP-XPS) 6.11.1 General |
| 31 | 6.11.2 Internal structure of bimetallic NP catalysts 6.11.3 Measurement of NP’s in liquid suspension |
| 33 | 7 Auger electron spectroscopy 7.1 General 7.2 Coating thickness measurement 7.2.1 General 7.2.2 Destructive depth-profiling |
| 34 | 7.2.3 Non-destructive depth-profiling 7.2.4 Elemental composition |
| 35 | 7.2.5 Imaging and line scans |
| 37 | 8 Complementary analysis |
| 40 | 9 Deviations from ideality 9.1 General 9.2 Multilayered coatings |
| 42 | 9.3 Other non-ideal cases |
| 47 | Annex A (informative) Example script for modelling of XPS data from nanoparticles |
| 49 | Bibliography |
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