BSI 23/30479765 DC 2023
$13.70
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Published By | Publication Date | Number of Pages |
BSI | 2023 | 17 |
PDF Catalog
PDF Pages | PDF Title |
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1 | 30479765-NC.pdf |
3 | 47_2814e_CDV.pdf |
5 | FOREWORD |
8 | INTRODUCTION Figure 1 — Safe Operating Area (SOA) for a conventional power transistor [1] |
10 | 1 Scope 2 Normative references 3 Terms, definitions, and letter symbols |
11 | 4 Test circuits and waveforms |
12 | 6.1 4.1 Inductive and resistive switching methods |
13 | Figure 2 — Test circuit typically used for double-pulse testing which is equivalent to a boost converter with its output tied to the input voltage source Figure 3 — Examples of circuits to provide continuous-switching operation with tunable iD-vDS locus: (a) inductive-load switching with a modified DPT circuit, (b) synchronous boost converter, (c) synchronous buck converter, (d) resistive-load switch… 6.2 4.2 Capture of waveforms and id-vds loci |
15 | Figure 4 — Waveforms of vGS, vDS, and iD in an inductive-load switching test, (a) DPT (b) continuous operation 6.3 4.3 Examples of waveforms and id-vds loci |
16 | Figure 5 — Simplified examples of time-domain waveforms for DUT operation in circuits, (a) inductive-load switching with hard-switched turn-on and turn-off, e.g., high-side in a buck converter or low-side in a boost converter, (b) soft-switched (ZVS) … |
17 | 5 Measurement considerations 6 References |