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BS ISO/IEC 23837-2:2023

$215.11

Information security. Security requirements, test and evaluation methods for quantum key distribution – Evaluation and testing methods

Published By Publication Date Number of Pages
BSI 2023 118
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PDF Catalog

PDF Pages PDF Title
2 undefined
8 Foreword
9 Introduction
11 1 Scope
2 Normative references
3 Terms and definitions
13 4 Abbreviated terms
14 5 Overview of the evaluation method for QKD modules
5.1 General
5.2 Scope of the evaluation method
15 5.3 Overview of evaluation activities for SFRs
5.3.1 General
16 5.3.2 EAs for SFRs FTP_QKD.1 and FTP_QKD.2
5.3.3 EAs for SFRs on quantum optical components and parameter adjustment procedure(s)
17 5.3.4 EAs for SFRs on conventional network components
5.3.5 Thresholds and input parameters related to the evaluation activities
18 5.4 Overview of evaluation activities for SARs
6 EAs for the evaluation of FTP_QKD
6.1 General
20 6.2 EA to test quantum state transmission and sifting procedures
6.2.1 General aspects
22 6.2.2 Test procedure
24 6.2.3 Pass/fail criteria
6.3 EA to test other post-processing procedures
6.3.1 General aspects
26 6.3.2 Test procedure
27 6.3.3 Pass/fail criteria
6.4 EA to test parameter adjustment procedure(s)
6.4.1 General aspects
29 6.4.2 Test procedure
6.4.3 Pass/fail criteria
7 EAs for evaluating quantum optical components in the transmitter module
7.1 General
32 7.2 EA to test the photon-number distribution of optical pulses
7.2.1 General aspects
34 7.2.2 Test procedure
35 7.2.3 Pass/fail criteria
7.3 EA to test the mean photon number and stability of optical pulses
7.3.1 General aspects
36 7.3.2 Test procedure
38 7.3.3 Pass/fail criteria
7.4 EA to test the independence of the intensities of optical pulses
7.4.1 General aspects
39 7.4.2 Test procedure
40 7.4.3 Pass/fail criteria
7.5 EA to test the accuracy of state encoding
7.5.1 General aspects
41 7.5.2 Test procedure
42 7.5.3 Pass/fail criteria
7.6 EA to test the indistinguishability of encoded states
7.6.1 General aspects
44 7.6.2 Test procedure
45 7.6.3 Pass/fail criteria
46 7.7 EA to test the uniform distribution of the global phase of optical pulses
7.7.1 General aspects
47 7.7.2 Test procedure
48 7.7.3 Pass/fail criteria
7.8 EA to test the degree of optical isolation of the TX module
7.8.1 General aspects
50 7.8.2 Test procedure
7.8.3 Pass/fail criteria
7.9 EA to test the sensitivity of the injected light monitor in the TX module
7.9.1 General aspects
51 7.9.2 Test procedure
52 7.9.3 Pass/fail criteria
7.10 EA to test the robustness of the TX module against laser injection
7.10.1 General aspects
54 7.10.2 Test procedure
56 7.10.3 Pass/fail criteria
57 8 EAs for the evaluation of quantum optical components in the receiver module
8.1 General
59 8.2 EA to test the consistency of detection probability in the RX module
8.2.1 General aspects
61 8.2.2 Test procedure
8.2.3 Pass/fail criteria
62 8.3 EA to test information leakage of back-flashes from the RX module
8.3.1 General aspects
63 8.3.2 Test procedure
64 8.3.3 Pass/fail criteria
8.4 EA to test the degree of optical isolation of the RX module
8.4.1 General aspects
65 8.4.2 Test procedure
8.4.3 Pass/fail criteria
66 8.5 EA to test the sensitivity of the injected light monitor in the RX module
8.5.1 General aspects
67 8.5.2 Test procedure
8.5.3 Pass/fail criteria
68 8.6 EA to test the robustness of the RX module against bright light blinding
8.6.1 General aspects
69 8.6.2 Test procedure
70 8.6.3 Pass/fail criteria
8.7 EA to test the appropriateness of dead time settings of SPDs
8.7.1 General aspect
71 8.7.2 Test procedure
72 8.7.3 Pass/fail criteria
8.8 EA to test the temporal profile of the detection efficiency for SPDs
8.8.1 General aspects
73 8.8.2 Test procedure
8.8.3 Pass/fail criteria
74 8.9 EA to test the robustness of the RX module against laser injection
8.9.1 General aspects
75 8.9.2 Test procedure
76 8.9.3 Pass/fail criteria
77 8.10 EA to test the detection limits of homodyne detectors in the RX module
8.10.1 General aspects
8.10.2 Test procedure
78 8.10.3 Pass/fail criteria
8.11 EA to test the appropriateness of double-click event handling
8.11.1 General aspects
79 8.11.2 Test procedure
8.11.3 Pass/fail criteria
9 EAs for the evaluation of parameter adjustment procedure(s)
9.1 General
80 9.2 EA to test the inducibility of detection probability mismatch
9.2.1 General aspects
83 9.2.2 Test procedure
84 9.2.3 Pass/fail criteria
9.3 EA to test the correctness of shot noise alignment
9.3.1 General aspects
85 9.3.2 Test procedure
87 9.3.3 Pass/fail criteria
10 Supplementary activities for the evaluation of SFRs on conventional network components
10.1 General
88 10.2 ​Evaluation activities for FCS related SFRs overview
10.3 ​Evaluation activities for other SFRs overview
11 Supplementary activities for SARs
11.1 General
11.2 Supplementary activities for Class APE: Protection Profile evaluation
90 11.3 Supplementary activities for Class ASE: Security Target evaluation
11.4 Supplementary activities for Class ADV: Development
11.4.1 Supplementary activities for ADV_ARC
91 11.4.2 Supplementary activities for ADV_FSP
92 11.5 Supplementary activities for Class AGD: Guidance documents
11.5.1 Supplementary activities for AGD_OPE
93 11.5.2 Supplementary activities for AGD_PRE
11.6 Supplementary activities for Class ATE: Test
11.6.1 Supplementary activities for ATE_FUN
94 11.6.2 Supplementary activities for ATE_IND
95 11.7 Supplementary activities for Class AVA: Vulnerability assessment
98 12 Conformance statement
12.1 General
12.2 Conformance statement specific to evaluation activities for SFRs
99 12.3 Conformance statement specific to EAs for SARs
100 Annex A (informative) Guidance on the calculation of attack potential for the evaluation of QKD modules
107 Annex B (informative) Rating examples for AVA attack potential computation
110 Annex C (informative) Thresholds collection
114 Annex D (informative) Correspondence between EAs and known attacks to quantum optical components and parameter adjustment procedure(s) of QKD modules
116 Bibliography
BS ISO/IEC 23837-2:2023
$215.11