BS ISO/IEC 23837-2:2023
$215.11
Information security. Security requirements, test and evaluation methods for quantum key distribution – Evaluation and testing methods
Published By | Publication Date | Number of Pages |
BSI | 2023 | 118 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
8 | Foreword |
9 | Introduction |
11 | 1 Scope 2 Normative references 3 Terms and definitions |
13 | 4 Abbreviated terms |
14 | 5 Overview of the evaluation method for QKD modules 5.1 General 5.2 Scope of the evaluation method |
15 | 5.3 Overview of evaluation activities for SFRs 5.3.1 General |
16 | 5.3.2 EAs for SFRs FTP_QKD.1 and FTP_QKD.2 5.3.3 EAs for SFRs on quantum optical components and parameter adjustment procedure(s) |
17 | 5.3.4 EAs for SFRs on conventional network components 5.3.5 Thresholds and input parameters related to the evaluation activities |
18 | 5.4 Overview of evaluation activities for SARs 6 EAs for the evaluation of FTP_QKD 6.1 General |
20 | 6.2 EA to test quantum state transmission and sifting procedures 6.2.1 General aspects |
22 | 6.2.2 Test procedure |
24 | 6.2.3 Pass/fail criteria 6.3 EA to test other post-processing procedures 6.3.1 General aspects |
26 | 6.3.2 Test procedure |
27 | 6.3.3 Pass/fail criteria 6.4 EA to test parameter adjustment procedure(s) 6.4.1 General aspects |
29 | 6.4.2 Test procedure 6.4.3 Pass/fail criteria 7 EAs for evaluating quantum optical components in the transmitter module 7.1 General |
32 | 7.2 EA to test the photon-number distribution of optical pulses 7.2.1 General aspects |
34 | 7.2.2 Test procedure |
35 | 7.2.3 Pass/fail criteria 7.3 EA to test the mean photon number and stability of optical pulses 7.3.1 General aspects |
36 | 7.3.2 Test procedure |
38 | 7.3.3 Pass/fail criteria 7.4 EA to test the independence of the intensities of optical pulses 7.4.1 General aspects |
39 | 7.4.2 Test procedure |
40 | 7.4.3 Pass/fail criteria 7.5 EA to test the accuracy of state encoding 7.5.1 General aspects |
41 | 7.5.2 Test procedure |
42 | 7.5.3 Pass/fail criteria 7.6 EA to test the indistinguishability of encoded states 7.6.1 General aspects |
44 | 7.6.2 Test procedure |
45 | 7.6.3 Pass/fail criteria |
46 | 7.7 EA to test the uniform distribution of the global phase of optical pulses 7.7.1 General aspects |
47 | 7.7.2 Test procedure |
48 | 7.7.3 Pass/fail criteria 7.8 EA to test the degree of optical isolation of the TX module 7.8.1 General aspects |
50 | 7.8.2 Test procedure 7.8.3 Pass/fail criteria 7.9 EA to test the sensitivity of the injected light monitor in the TX module 7.9.1 General aspects |
51 | 7.9.2 Test procedure |
52 | 7.9.3 Pass/fail criteria 7.10 EA to test the robustness of the TX module against laser injection 7.10.1 General aspects |
54 | 7.10.2 Test procedure |
56 | 7.10.3 Pass/fail criteria |
57 | 8 EAs for the evaluation of quantum optical components in the receiver module 8.1 General |
59 | 8.2 EA to test the consistency of detection probability in the RX module 8.2.1 General aspects |
61 | 8.2.2 Test procedure 8.2.3 Pass/fail criteria |
62 | 8.3 EA to test information leakage of back-flashes from the RX module 8.3.1 General aspects |
63 | 8.3.2 Test procedure |
64 | 8.3.3 Pass/fail criteria 8.4 EA to test the degree of optical isolation of the RX module 8.4.1 General aspects |
65 | 8.4.2 Test procedure 8.4.3 Pass/fail criteria |
66 | 8.5 EA to test the sensitivity of the injected light monitor in the RX module 8.5.1 General aspects |
67 | 8.5.2 Test procedure 8.5.3 Pass/fail criteria |
68 | 8.6 EA to test the robustness of the RX module against bright light blinding 8.6.1 General aspects |
69 | 8.6.2 Test procedure |
70 | 8.6.3 Pass/fail criteria 8.7 EA to test the appropriateness of dead time settings of SPDs 8.7.1 General aspect |
71 | 8.7.2 Test procedure |
72 | 8.7.3 Pass/fail criteria 8.8 EA to test the temporal profile of the detection efficiency for SPDs 8.8.1 General aspects |
73 | 8.8.2 Test procedure 8.8.3 Pass/fail criteria |
74 | 8.9 EA to test the robustness of the RX module against laser injection 8.9.1 General aspects |
75 | 8.9.2 Test procedure |
76 | 8.9.3 Pass/fail criteria |
77 | 8.10 EA to test the detection limits of homodyne detectors in the RX module 8.10.1 General aspects 8.10.2 Test procedure |
78 | 8.10.3 Pass/fail criteria 8.11 EA to test the appropriateness of double-click event handling 8.11.1 General aspects |
79 | 8.11.2 Test procedure 8.11.3 Pass/fail criteria 9 EAs for the evaluation of parameter adjustment procedure(s) 9.1 General |
80 | 9.2 EA to test the inducibility of detection probability mismatch 9.2.1 General aspects |
83 | 9.2.2 Test procedure |
84 | 9.2.3 Pass/fail criteria 9.3 EA to test the correctness of shot noise alignment 9.3.1 General aspects |
85 | 9.3.2 Test procedure |
87 | 9.3.3 Pass/fail criteria 10 Supplementary activities for the evaluation of SFRs on conventional network components 10.1 General |
88 | 10.2 Evaluation activities for FCS related SFRs overview 10.3 Evaluation activities for other SFRs overview 11 Supplementary activities for SARs 11.1 General 11.2 Supplementary activities for Class APE: Protection Profile evaluation |
90 | 11.3 Supplementary activities for Class ASE: Security Target evaluation 11.4 Supplementary activities for Class ADV: Development 11.4.1 Supplementary activities for ADV_ARC |
91 | 11.4.2 Supplementary activities for ADV_FSP |
92 | 11.5 Supplementary activities for Class AGD: Guidance documents 11.5.1 Supplementary activities for AGD_OPE |
93 | 11.5.2 Supplementary activities for AGD_PRE 11.6 Supplementary activities for Class ATE: Test 11.6.1 Supplementary activities for ATE_FUN |
94 | 11.6.2 Supplementary activities for ATE_IND |
95 | 11.7 Supplementary activities for Class AVA: Vulnerability assessment |
98 | 12 Conformance statement 12.1 General 12.2 Conformance statement specific to evaluation activities for SFRs |
99 | 12.3 Conformance statement specific to EAs for SARs |
100 | Annex A (informative) Guidance on the calculation of attack potential for the evaluation of QKD modules |
107 | Annex B (informative) Rating examples for AVA attack potential computation |
110 | Annex C (informative) Thresholds collection |
114 | Annex D (informative) Correspondence between EAs and known attacks to quantum optical components and parameter adjustment procedure(s) of QKD modules |
116 | Bibliography |