BS ISO 17862:2013
$167.15
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 36 |
This International Standard specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. This International Standard can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | Section sec_1 Section sec_2 Section sec_2.1 Section sec_2.2 1 Scope 2 Symbols and abbreviations 2.1 Abbreviated terms 2.2 Symbols |
| 10 | Section sec_3 3 Outline of method |
| 12 | Figure fig_1 |
| 13 | Section sec_4 Section sec_4.1 Section sec_4.2 Section sec_4.3 Section sec_4.3.1 Section sec_4.3.2 4 Procedure for evaluating the intensity linearity 4.1 Obtaining the reference sample 4.2 Preparation for mounting the sample 4.3 Mounting the sample |
| 14 | Section sec_4.4 Section sec_4.4.1 Section sec_4.4.2 Section sec_4.4.2.1 Section sec_4.4.2.2 Section sec_4.4.2.3 Section sec_4.4.2.4 4.4 Operating the instrument |
| 15 | Section sec_4.4.2.5 Section sec_4.4.2.6 Section sec_4.4.3 Section sec_4.4.3.1 Section sec_4.4.3.2 Section sec_4.4.3.3 Section sec_4.4.3.4 |
| 16 | Figure fig_2 Section sec_4.4.4 Section sec_4.4.5 Section sec_4.5 Section sec_4.5.1 4.5 Acquiring the data |
| 17 | Table tab_c Figure fig_3 Section sec_4.5.2 Section sec_4.5.3 Section sec_4.5.4 |
| 18 | Figure fig_4 Section sec_4.5.5 Table tab_1 Section sec_4.5.6 |
| 19 | Section sec_4.5.7 Section sec_4.5.8 Section sec_4.5.9 Section sec_4.5.10 Section sec_4.5.11 Section sec_4.5.12 Section sec_4.5.13 Section sec_4.5.14 |
| 20 | Section sec_4.6 Section sec_4.6.1 Section sec_4.6.2 4.6 Checking the linearity |
| 21 | Section sec_4.6.3 Section sec_4.6.4 Section sec_4.6.4.1 |
| 22 | Section sec_4.6.4.2 |
| 23 | Figure fig_5 Section sec_4.6.4.3 Section sec_4.6.5 Section sec_4.6.5.1 |
| 24 | Figure fig_6 |
| 25 | Section sec_4.6.5.2 Section sec_4.6.5.3 Section sec_4.6.5.4 Section sec_5 5 Interval for repeat measurements |
| 26 | Annex sec_A Annex sec_A.1 Annex sec_A.2 Annex A (normative) Computation of raster size, ion beam current, number of frames for analysis, and counts per pulse |
| 27 | Annex sec_A.3 |
| 28 | Annex sec_B Figure fig_B.1 Annex B (normative) Charge compensation setting |
| 29 | Annex sec_C Figure fig_C.1 Annex C (normative) Ion detector setting |
| 30 | Figure fig_C.2 |
| 31 | Annex sec_D Annex sec_D.1 Annex sec_D.2 Annex D (informative) Instrumental factors affecting linearity |
| 32 | Annex sec_D.3 Annex sec_D.4 |
| 33 | Reference ref_1 Reference ref_2 Reference ref_3 Reference ref_4 Reference ref_5 Reference ref_6 Reference ref_7 Reference ref_8 Reference ref_9 Reference ref_10 Reference ref_11 Reference ref_12 Reference ref_13 Reference ref_14 Reference ref_15 Reference ref_16 Bibliography |
