BS EN IEC 62631-2-2:2022
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Dielectric and resistive properties of solid insulating materials – Relative permittivity and dissipation factor. High frequencies (1 MHz to 300 MHz). AC methods
Published By | Publication Date | Number of Pages |
BSI | 2022 | 34 |
This part of IEC 62631 specifies test methods for the determination of permittivity and dissipation factor properties of solid insulating materials in a high frequency range from 1 MHz to 300 MHz.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
5 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
7 | English CONTENTS |
9 | FOREWORD |
11 | INTRODUCTION |
12 | 1 Scope 2 Normative references 3 Terms and definitions |
13 | 4 Methods of test 4.1 Basic theory |
15 | Figures Figure 1 – Dielectric dissipation factor |
16 | Figure 2 – Equivalent circuit diagrams with capacitive test specimen |
17 | 4.2 Distinctive factors for the measurement in high frequency range Figure 3 – Equivalent parallel circuit for test fixture with sample and leads to equipment |
18 | 4.3 Power supply 4.4 Equipment 4.4.1 Accuracy |
19 | 4.4.2 Distinctive feature of equipment for measurement in high frequency range |
20 | 4.4.3 Choice of measurement methods Figure 4 – Existence of residual impedance andstray capacitance in directly connected system |
21 | 4.5 Calibration 4.6 Test specimen 4.6.1 General 4.6.2 Recommended dimensions of test specimen and electrode arrangements 4.6.3 Number of test specimens 4.6.4 Conditioning and pre-treatment of test specimen Table 1 – Applicable frequency range in effective apparatus |
22 | 4.7 Procedures for specific materials 5 Test procedure 5.1 General 5.2 Calculation of permittivity and relative permittivity 5.2.1 Relative permittivity 5.2.2 Dielectric dissipation factor tan δ 6 Report |
23 | 7 Repeatability and reproducibility |
24 | Annex A (informative)Compensation method using a series circuit Figure A.1 – Compensation method using a series circuit |
25 | Annex B (informative)Parallel electrodes with shield ring Figure B.1 – Configuration of parallel electrode with shield ring |
26 | Annex C (informative)Apparatus C.1 Parallel T network bridge Figure C.1 – Parallel T network, principal circuit diagram Figure C.2 – Parallel T network, practical circuit diagram |
27 | C.2 Resonance method |
28 | Figure C.3 – Principle of resonance method, circuit diagram(originally from Q meter) |
29 | C.3 I-V method designed for high frequencies C.4 Auto-balancing bridge method |
30 | Figure C.4 – Auto-balancing circuit |
31 | Annex D (informative)Non-contacting electrode method withmicrometer-controlled parallel electrodes in air |
32 | Figure D.1 – Non-contacting electrode method |
33 | Bibliography |