BS EN IEC 60749-12:2018
$86.31
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 12 |
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 5 | English CONTENTS |
| 6 | FOREWORD |
| 8 | 1 Scope 2 Normative references 3 Terms and definitions 4 Test apparatus 5 Test method |
| 9 | 6 Examination and test measurements 7 Failure criteria 8 Summary Table 1 – Test conditions |
| 10 | Bibliography |
Related products
-
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
