BS EN IEC 60747-16-7:2022:2023 Edition
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Semiconductor devices – Microwave integrated circuits. Attenuators
Published By | Publication Date | Number of Pages |
BSI | 2023 | 50 |
This part of IEC 60747 specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit attenuators.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
7 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
9 | English CONTENTS |
12 | FOREWORD |
14 | 1 Scope 2 Normative references 3 Terms and definitions |
17 | 4 Essential ratings and characteristics 4.1 General requirements 4.1.1 Circuit identification and types |
18 | 4.1.2 General function description 4.1.3 Manufacturing technology 4.1.4 Package identification 4.2 Application description 4.2.1 Conformance to system and/or interface information 4.2.2 Overall block diagram 4.2.3 Reference data 4.2.4 Electrical compatibility |
19 | 4.2.5 Associated devices 4.3 Specification of the function 4.3.1 Detailed block diagram – Functional blocks 4.3.2 Identification and function of terminals Tables Table 1 – Function of terminals |
20 | 4.3.3 Function description 4.4 Limiting values (absolute maximum rating system) 4.4.1 Requirements 4.4.2 Electrical limiting values |
21 | 4.4.3 Temperatures Table 2 – Electrical limiting values Table 3 – Electrical limiting values in detail specification Table 4 – Temperatures |
22 | 4.5 Operating conditions (within the specified operating temperature range) 4.6 Electrical characteristics 4.7 Mechanical and environmental ratings, characteristics and data Table 5 – Electrical characteristics |
23 | 4.8 Additional information 5 Measuring methods 5.1 General 5.1.1 General precautions 5.1.2 Characteristic impedance 5.1.3 Handling precautions 5.1.4 Types |
24 | 5.2 Transmission loss (Ltrans) and insertion loss (Lins) 5.2.1 Purpose 5.2.2 Measuring methods Figures Figure 1 – Circuit diagram for the measurement of the transmission lossand insertion loss (method 1) |
26 | Figure 2 – Circuit diagram for the measurement of the scattering parameters |
27 | 5.3 Attenuation value (Aatt) 5.3.1 Purpose 5.3.2 Measuring methods |
29 | 5.4 Attenuation range (Aran) 5.4.1 Purpose 5.4.2 Measuring methods |
31 | 5.5 Attenuation accuracy (Aaur), Attenuation accuracy (RMS) (Aaur(RMS)) 5.5.1 Purpose 5.5.2 Measuring methods |
33 | 5.6 Input return loss (Lret(in)) 5.6.1 Purpose 5.6.2 Measuring methods |
34 | Figure 3 – Circuit diagram for the measurement of the return loss (method 1) |
36 | 5.7 Output return loss (Lret(out)) 5.7.1 Purpose 5.7.2 Measuring methods |
38 | 5.8 Input power at n dB compression (Pi(ndB)) 5.8.1 Purpose 5.8.2 Circuit diagram 5.8.3 Principle of measurement 5.8.4 Circuit description and requirements 5.8.5 Precautions to be observed 5.8.6 Measurement procedure 5.8.7 Specified conditions |
39 | 5.9 Intermodulation distortion (two-tone)(Pn/P1) 5.9.1 Purpose 5.9.2 Circuit diagram 5.9.3 Principle of measurement Figure 4 – Circuit diagram for the measurement of intermodulation distortion |
40 | 5.9.4 Circuit description and requirements 5.9.5 Precautions to be observed 5.9.6 Measurement procedure 5.9.7 Specified conditions |
41 | 5.10 Power at the intercept point (for intermodulation products) (Pn(IP)) 5.10.1 Purpose 5.10.2 Circuit diagram 5.10.3 Principle of measurement 5.10.4 Circuit description and requirements 5.10.5 Precautions to be observed 5.10.6 Measurement procedure 5.10.7 Specified conditions |
42 | 5.11 Relative phase shift (θrel) 5.11.1 Purpose 5.11.2 Circuit diagram 5.11.3 Principle of measurement 5.11.4 Circuit description and requirements 5.11.5 Precautions to be observed |
43 | 5.11.6 Measurement procedure 5.11.7 Specified conditions 5.12 Turn on time(ton), turn off time(toff), rise time(tr(out)), fall time(tf(out)) 5.12.1 Purpose 5.12.2 Circuit diagram 5.12.3 Principle of measurement Figure 5 – Circuit diagram for the measurement of response times and switching times |
44 | Figure 6 – Input and output waveforms |
45 | 5.12.4 Circuit description and requirements 5.12.5 Precautions to be observed 5.12.6 Measurement procedure 5.12.7 Specified conditions 5.13 Control voltage sensitivity (Svcont) 5.13.1 Purpose 5.13.2 Measuring methods |
48 | Bibliography |