BS EN 62391-1:2016:2017 Edition
$198.66
Fixed electric double-layer capacitors for use in electric and electronic equipment – Generic specification
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 64 |
This part of IEC 62391 applies to fixed electric double-layer capacitors (hereafter referred to as capacitor(s)) mainly used in d.c. circuits of electric and electronic equipment.
This part of IEC 62391 establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 7 | CONTENTS |
| 12 | FOREWORD |
| 14 | 1 Scope 2 Normative references |
| 15 | 3 Terms and definitions |
| 19 | 4 General items 4.1 Unit and symbols 4.2 Preferred values and class 4.2.1 General |
| 20 | 4.2.2 Preferred values of nominal capacitance 4.2.3 Class 4.3 Marking 4.3.1 General 4.3.2 Coding 4.4 Quality assessment procedures 5 Tests and measurement 5.1 General 5.2 Test and measurement requirements 5.2.1 Test conditions 5.2.2 Measurement conditions |
| 21 | 5.2.3 Voltage treatment 5.2.4 Thermal treatment 5.3 Drying 5.4 Visual examination and check of dimensions 5.4.1 Visual examination 5.4.2 Dimensions (gauging) 5.4.3 Dimensions (detail) 5.5 Measurement method 1 for capacitance and internal resistance (constant current discharge) 5.5.1 Basic circuit for measuring |
| 22 | 5.5.2 Measuring equipment Figures Figure 1 − Basic circuit for measuring |
| 23 | 5.5.3 Measuring procedure Figure 2 – Voltage–time characteristics between capacitor terminals in capacitance and internal resistance measurement |
| 24 | Tables Table 1 – Measuring conditions for measuring method 1A |
| 25 | 5.5.4 Calculation methods for capacitance Table 2 – Measuring conditions for measuring method 1B |
| 26 | 5.5.5 Calculation methods for internal resistance |
| 27 | 5.5.6 Conditions to be prescribed in the detail specification 5.6 Measurement method 2 for capacitance and internal resistance 5.6.1 Constant resistance charging method for capacitance measurement Figure 3 − Circuit for constant resistance charging method |
| 28 | 5.6.2 AC internal resistance measuring method 5.7 Leakage current 5.7.1 Measuring method Figure 4 − Circuit for a.c. resistance method |
| 29 | 5.7.2 Items to be specified in the detail specification 5.8 Maintain voltage 5.8.1 Measuring method Figure 5 − Maintain voltage test diagram |
| 30 | 5.8.2 Calculation of voltage maintenance rate 5.8.3 Conditions to be prescribed in the detail specification 5.9 Robustness of terminations 5.9.1 Test Ua1 – Tensile 5.9.2 Test Ub – Bending (half of the sample) Table 3 – Tensile force |
| 31 | 5.9.3 Test Uc – Torsion (remaining sample) 5.9.4 Test Ud – Torque (for terminations with threaded studs or screws and for integral mounting devices) 5.9.5 Visual examination 5.10 Resistance to soldering heat 5.10.1 Preconditioning and initial measurement 5.10.2 Test 5.10.3 Recovery Table 4 – Torque |
| 32 | 5.10.4 Final inspection, measurements and requirements 5.11 Solderability 5.11.1 General 5.11.2 Preconditioning 5.11.3 Capacitors with leads |
| 33 | 5.11.4 Surface mount capacitors 5.12 Rapid change of temperature 5.12.1 Initial measurement 5.12.2 Test 5.12.3 Final inspection, measurements and requirements 5.13 Vibration 5.13.1 Initial measurement 5.13.2 Test |
| 34 | 5.13.3 Final measurement and requirements 5.14 Damp heat, steady state 5.14.1 Initial measurement 5.14.2 Test 5.14.3 Final measurement 5.15 Endurance 5.15.1 Initial measurements 5.15.2 Test 5.15.3 Final measurement, inspection and requirements |
| 35 | 5.16 Storage 5.16.1 Storage at high temperature 5.16.2 Storage at low temperature 5.17 Characteristics at high and low temperature 5.17.1 General 5.17.2 Test procedure |
| 36 | 5.17.3 Dry heat 5.17.4 Cold 5.17.5 Final measurement and requirements 5.18 Component solvent resistance 5.18.1 Initial measurements 5.18.2 Test 5.18.3 Requirements 5.19 Solvent resistance of marking 5.19.1 Test |
| 37 | 5.19.2 Requirements 5.20 Passive flammability 5.20.1 Test procedure 5.20.2 Requirements 5.21 Pressure relief (if applicable) 5.21.1 Test 5.21.2 Requirements Table 5 – Severities and requirements |
| 38 | Annexes Annex A (normative) Classification according to capacitance and internal resistance A.1 General A.2 Classification by capacitance and internal resistance |
| 39 | Figure A.1 – Conceptual rendering orientated by characteristics in each classification Table A.1 – Electrical performance and measuring method by class |
| 40 | Annex B (informative) Measuring method of capacitance and low resistanceby low frequency a.c. method (reference) B.1 General B.2 Measuring system B.3 Calculation of capacitance Figure B.1 – Capacitance measuring system by the low frequency a.c. method |
| 41 | B.4 Measuring conditions |
| 42 | Annex C (informative) Thermal equilibrium time of capacitors C.1 General C.2 Thermal equilibrium time of capacitors Figure C.1 – Thermal equilibrium times of capacitors (from 85 °C to 25 °C) |
| 43 | Figure C.2 – Thermal equilibrium times of capacitors (from −40 °C to 25 °C) Figure C.3 – Capacitor core temperature change with respect to time |
| 44 | Annex D (informative) Charging/discharging efficiency and measurement current D.1 General D.2 Charging efficiency, discharging efficiency, and current |
| 46 | Annex E (informative) Procedures for setting the measurement current of capacitor with uncertain nominal internal resistance E.1 General E.2 Current setting procedures for measurement of capacitor E.3 Example of setting current for determining capacitor characteristics Table E.1 – Example of setting current for measurement of capacitor |
| 47 | Annex F (informative) Policy on uncertainty of measurement and inset limits F.1 Objective F.2 Terms and definitions F.3 Calculation of measurement uncertainty |
| 48 | F.4 Policy F.5 Calculation of inset and outset limits F.6 Examples F.6.1 General F.6.2 Example 1: Resistor measurement |
| 49 | F.6.3 Example 2: Resistor measurement F.6.4 Example 3: Transistor measurement (gain) F.6.5 Example 4: Comparison between initial and final measurement results |
| 50 | Annex G (informative) Reference to IEC 62391-1:2006 |
| 51 | Annex Q (normative) Quality assessment procedures Q.1 General Q.1.1 Overview Q.1.2 Applicability of qualification approval Q.1.3 Applicability of capability approval |
| 52 | Q.1.4 Applicability of technology approval Q.2 Primary stage of manufacture Q.3 Subcontracting Q.4 Structurally similar components Q.5 Qualification approval procedures Q.5.1 Eligibility for qualification approval |
| 53 | Q.5.2 Application for qualification approval Q.5.3 Test procedure for qualification approval Q.5.4 Granting of qualification approval Q.5.5 Maintenance of qualification approval Q.5.6 Quality conformance inspection Q.6 Capability approval procedures Q.6.1 General |
| 54 | Q.6.2 Eligibility for capability approval Q.6.3 Application for capability approval Q.6.4 Description of capability Figure Q.1 – General scheme for capability approval |
| 55 | Q.6.5 Demonstration and verification of capability Q.6.6 Programme for capability approval |
| 56 | Q.6.7 Capability approval test report Q.6.8 Abstract of description of capability Q.6.9 Modifications likely to affect the capability approval Q.6.10 Initial capability approval |
| 57 | Q.6.11 Granting of capability approval Q.6.12 Maintenance of capability approval |
| 58 | Q.6.13 Extension of capability approval Q.6.14 Quality conformance inspection Q.7 Rework and repair Q.7.1 Rework |
| 59 | Q.7.2 Repair Q.8 Release for delivery Q.8.1 General Q.8.2 Release for delivery under qualification approval before the completion of Group B tests Q.9 Certified test records of released lots Q.10 Delayed delivery Q.11 Alternative test methods Q.12 Manufacture outside the geographical limits of IECQ CBs Q.13 Unchecked parameters |
| 60 | Q.14 Technology approval procedures Q.14.1 General Q.14.2 Eligibility for technology approval Q.14.3 Application of technology approval Q.14.4 Description of technology Q.14.5 Demonstration and verification of the technology Q.14.6 Granting of technology approval Q.14.7 Maintenance of technology approval Q.14.8 Quality conformance inspection |
| 61 | Q.14.9 Failure rate level determination Q.14.10 Outgoing quality level |
| 62 | Bibliography |
Related products
-
BS EN 62391-1:2016:2019 Edition
Fixed electric double-layer capacitors for use in electric and electronic equipment – Generic specification Published…
