BS EN 60749-4:2002

$86.31

Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress test (HAST)

Published By	Publication Date	Number of Pages
BSI	2002	12

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.

Additional information

Status	Withdrawn
Partially Replaces	BS EN 60749:1999
Title	Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress test (HAST)
Publisher	BSI
Committee	EPL/47
Pages	12
Publication Date	2002-09-10
Withdrawn Date	2017-11-28
Replaced By	BS EN 60749-4:2017
ISBN	0 580 40335 1
Standard Number	BS EN 60749-4:2002
Identical National Standard Of	IEC 60749-4:2002, EN 60749-4 (IEC 60749-4:2002) AS
Descriptors	Climate, Electronic equipment and components, Integrated circuits, Environmental testing, Accelerated testing, Damp-heat tests, Mechanical testing, Semiconductor devices
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-4:2002

$86.31


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