BS EN 15991:2011
$142.49
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 32 |
| Status | Withdrawn |
|---|---|
| Title | Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) |
| Publisher | BSI |
| Committee | RPI/1 |
| Pages | 32 |
| Publication Date | 2011-02-28 |
| Withdrawn Date | 2015-11-30 |
| Replaced By | BS EN 15991:2015 |
| ISBN | 978 0 580 64180 0 |
| Standard Number | BS EN 15991:2011 |
| Identical National Standard Of | EN 15991:2011 |
| Descriptors | Particulate materials, Silicon inorganic compounds, Vaporization, Emission spectrophotometry, Ceramics, Determination of content, Trace element analysis, Impurities, Carbides, Chemical analysis and testing, Refractory materials, Raw materials |
| ICS Codes | 81.060.10 - Raw materials |
