{"id":431228,"date":"2024-10-20T07:27:03","date_gmt":"2024-10-20T07:27:03","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61280-4-12019a12022-2\/"},"modified":"2024-10-26T14:09:52","modified_gmt":"2024-10-26T14:09:52","slug":"bs-en-iec-61280-4-12019a12022-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61280-4-12019a12022-2\/","title":{"rendered":"BS EN IEC 61280-4-1:2019+A1:2022"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
7<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
12<\/td>\nFOREWORD <\/td>\n<\/tr>\n
14<\/td>\n1 Scope
2 Normative references
3 Terms, definitions, graphical symbols and abbreviated terms <\/td>\n<\/tr>\n
15<\/td>\n3.1 Terms and definitions <\/td>\n<\/tr>\n
17<\/td>\n3.2 Graphical symbols <\/td>\n<\/tr>\n
18<\/td>\nFigures
Figure 1 \u2013 Connector symbols
Figure 2 \u2013 Symbol for cabling under test <\/td>\n<\/tr>\n
19<\/td>\n3.3 Abbreviated terms
4 Test methods
4.1 General <\/td>\n<\/tr>\n
20<\/td>\n4.2 Cabling configurations and applicable test methods
Tables
Table 1 \u2013 Cabling configurations
Table 2 \u2013 Test methods and configurations <\/td>\n<\/tr>\n
21<\/td>\nFigure 3 \u2013 Reference plane for configuration A tested with the 1-cord method
Figure 4 \u2013 Reference plane for configuration B tested with the 3-cord method <\/td>\n<\/tr>\n
22<\/td>\n5 Overview of uncertainties
5.1 General
5.2 Sources of significant uncertainties
Figure 5 \u2013 Reference plane for configuration C tested with the 2-cord method
Figure 6 \u2013 Reference plane for configuration D tested with the EC method <\/td>\n<\/tr>\n
23<\/td>\n5.3 Consideration of the PM
5.4 Consideration of test cord connector grade
5.5 Typical uncertainty values
Table 3 \u2013 Measurements bias related to test cord connector grade <\/td>\n<\/tr>\n
24<\/td>\n6 Apparatus
6.1 General
6.2 Light source
6.2.1 Stability
6.2.2 Spectral characteristics (LSPM measurement)
Table 4 \u2013 Uncertainty for a given attenuation at 850 nm
Table 5 \u2013 Spectral requirements <\/td>\n<\/tr>\n
25<\/td>\n6.3 Launch cord
6.4 Receive or tail cord <\/td>\n<\/tr>\n
26<\/td>\n6.5 Substitution cord
6.6 Power meter \u2013 LSPM methods only
6.7 OTDR apparatus
Figure 7 \u2013 OTDR schematic <\/td>\n<\/tr>\n
27<\/td>\n6.8 Connector end face cleaning and inspection equipment
6.9 Adapters
7 Procedures
7.1 General
7.2 Common procedures
7.2.1 Care of the test cords
7.2.2 Make reference measurements (LSPM methods only)
7.2.3 Inspect and clean the ends of the optical fibres in the cabling <\/td>\n<\/tr>\n
28<\/td>\n7.2.4 Make the measurements
7.2.5 Make the calculations
7.2.6 Duplex and bi-directional testing
7.3 Calibration
7.4 Safety
8 Calculations
9 Documentation
9.1 Information for each test <\/td>\n<\/tr>\n
29<\/td>\n9.2 Information to be available <\/td>\n<\/tr>\n
30<\/td>\nAnnexes
Annex A (normative) One-cord method
A.1 Applicability of test method
A.2 Apparatus
A.3 Procedure <\/td>\n<\/tr>\n
31<\/td>\nA.4 Calculation
A.5 Components of reported attenuation
Figure A.1 \u2013 Reference measurement
Figure A.2 \u2013 Test measurement <\/td>\n<\/tr>\n
32<\/td>\nAnnex B (normative) Three-cord method
B.1 Applicability of test method
B.2 Apparatus
B.3 Procedure
Figure B.1 \u2013 Reference measurement <\/td>\n<\/tr>\n
33<\/td>\nB.4 Calculations
B.5 Components of reported attenuation
Figure B.2 \u2013 Test measurement <\/td>\n<\/tr>\n
34<\/td>\nAnnex C (normative) Two-cord method
C.1 Applicability of test method
C.2 Apparatus
C.3 Procedure
Figure C.1 \u2013 Reference measurement <\/td>\n<\/tr>\n
35<\/td>\nC.4 Calculations
C.5 Components of reported attenuation
Figure C.2 \u2013 Test measurement
Figure C.3 \u2013 Test measurement for plug-socket style connectors <\/td>\n<\/tr>\n
37<\/td>\nAnnex D (normative) Equipment cord method
D.1 Applicability of the test method
D.2 Apparatus
D.3 Procedure <\/td>\n<\/tr>\n
38<\/td>\nD.4 Calculation
D.5 Components of reported attenuation
Figure D.1 \u2013 Reference measurement
Figure D.2 \u2013 Test measurement <\/td>\n<\/tr>\n
39<\/td>\nD.6 Typical uncertainty values
Table D.1 \u2013 Uncertainty for a given attenuation at 850 nm <\/td>\n<\/tr>\n
40<\/td>\nAnnex E (normative) Optical time domain reflectometer
E.1 Applicability of the test method
E.2 Apparatus
E.2.1 General
E.2.2 OTDR
E.2.3 Test cords <\/td>\n<\/tr>\n
41<\/td>\nE.3 Procedure (test method)
Figure E.1 \u2013 OTDR method <\/td>\n<\/tr>\n
42<\/td>\nE.4 Calculation
E.4.1 General
E.4.2 Connection location
Figure E.2 \u2013 Location of the ports of the cabling under test <\/td>\n<\/tr>\n
43<\/td>\nE.4.3 Definition of power levels F1 and F2
E.4.4 Alternative calculation
Figure E.3 \u2013 Graphic construction of F1 and F2 <\/td>\n<\/tr>\n
45<\/td>\nE.5 OTDR uncertainties
Figure E.4 \u2013 Graphic construction of F1, F11, F12 and F2 <\/td>\n<\/tr>\n
47<\/td>\nAnnex F (normative) Requirements for the source characteristics
F.1 Encircled flux
F.2 Assumptions and limitations
F.3 Encircled flux templates
F.3.1 General <\/td>\n<\/tr>\n
48<\/td>\nF.3.2 Uncertainties expectations
F.3.3 Templates
Table F.1 \u2013 Attenuation, threshold tolerance and confidence level
Table F.2 \u2013 EF requirements for 50 \u00b5m core optical fibre cabling at 850 nm <\/td>\n<\/tr>\n
49<\/td>\nF.4 Graphical representation of templates
Table F.3 \u2013 EF requirements for 50 \u03bcm core optical fibre cabling at 1 300 nm
Table F.4 \u2013 EF requirements for 62,5 \u03bcm core optical fibre cabling at 850 nm
Table F.5 \u2013 EF requirements for 62,5 \u03bcm core optical fibre cabling at 1 300 nm <\/td>\n<\/tr>\n
50<\/td>\nFigure F.1 \u2013 Encircled flux example <\/td>\n<\/tr>\n
51<\/td>\nAnnex G (informative) OTDR configuration information
G.1 General <\/td>\n<\/tr>\n
52<\/td>\nG.2 Fundamental parameters that define the operational capability of an OTDR
G.2.1 Dynamic range
G.2.2 Pulse width
G.2.3 Averaging time
G.2.4 Dead zone
G.3 Other parameters
G.3.1 Index of refraction <\/td>\n<\/tr>\n
53<\/td>\nG.3.2 Measurement range
G.3.3 Distance sampling
G.4 Other measurement configurations
G.4.1 General
G.4.2 Macrobend or splice attenuation measurement
Table G.1 \u2013 Default effective group index of refraction values <\/td>\n<\/tr>\n
54<\/td>\nG.4.3 Splice attenuation measurement
G.4.4 Measurement with high reflection connectors or short length cabling
Figure G.1 \u2013 Splice and macrobend attenuation measurement <\/td>\n<\/tr>\n
55<\/td>\nFigure G.2 \u2013 Attenuation measurement with high reflection connectors <\/td>\n<\/tr>\n
56<\/td>\nG.4.5 Ghost
Figure G.3 \u2013 Attenuation measurement of a short length cabling <\/td>\n<\/tr>\n
57<\/td>\nG.5 More on the measurement method
Figure G.4 \u2013 OTDR trace with ghost <\/td>\n<\/tr>\n
58<\/td>\nG.6 Bi-directional measurement
Figure G.5 \u2013 Cursor positioning <\/td>\n<\/tr>\n
59<\/td>\nG.7 Non-recommended practices
G.7.1 Measurement without tail test cord
G.7.2 Cursor measurement <\/td>\n<\/tr>\n
60<\/td>\nAnnex H (informative) Test cord attenuation verification
H.1 General
H.2 Apparatus
H.3 Procedure
H.3.1 General <\/td>\n<\/tr>\n
61<\/td>\nH.3.2 Test cord verification for the one-cord and two-cord methods when using non-pinned\/unpinned and non-plug\/socket style connectors <\/td>\n<\/tr>\n
62<\/td>\nH.3.3 Test cord verification for the one-cord and two-cord methods when using pinned\/unpinned or plug\/socket style connectors
Figure H.1 \u2013 Obtaining reference power level P0
Figure H.2 \u2013 Obtaining power level P1 <\/td>\n<\/tr>\n
63<\/td>\nFigure H.3 \u2013 Obtaining reference power level P0
Figure H.4 \u2013 Obtaining power level P1 <\/td>\n<\/tr>\n
64<\/td>\nH.3.4 Test cord verification for the three-cord method when using non-pinned\/unpinned and non-plug\/socket style connectors
Figure H.5 \u2013 Obtaining reference power level P0
Figure H.6 \u2013 Obtaining power level <\/td>\n<\/tr>\n
65<\/td>\nFigure H.7 \u2013 Obtaining reference power level P0
Figure H.8 \u2013 Obtaining power level P1 <\/td>\n<\/tr>\n
66<\/td>\nH.3.5 Test cord verification for the three-cord method when using pinned\/unpinned or plug\/socket style connectors
Figure H.9 \u2013 Obtaining power level P5 <\/td>\n<\/tr>\n
67<\/td>\nFigure H.10 \u2013 Obtaining reference power level P0
Figure H.11 \u2013 Obtaining power level P1 <\/td>\n<\/tr>\n
68<\/td>\nAnnex I (normative) On the use of reference-grade test cords
I.1 General
I.2 Practical configurations and assumptions
I.2.1 Component specifications <\/td>\n<\/tr>\n
69<\/td>\nI.2.2 Conventions
I.2.3 Reference planes
I.3 Impact of using reference grade test cords for recommended LSPM methods <\/td>\n<\/tr>\n
70<\/td>\nI.4 Examples for LSPM measurements
I.4.1 Example 1 (configuration A, 1-C method \u2013 Annex A)
I.4.2 Example 2 (configuration D, EC method \u2013 Annex D)
Table I.1 \u2013 Measurement bias when using reference-grade test cords <\/td>\n<\/tr>\n
71<\/td>\nI.5 Impact of using reference-grade test cords for different configurations using the OTDR test method
I.5.1 Cabling configurations A, B and C
Figure I.1 \u2013 Cabling configurations A, B and C tested with the OTDR method <\/td>\n<\/tr>\n
72<\/td>\nI.5.2 Cabling configuration D
Table I.2 \u2013 Measurement bias when using reference grade test cords \u2013 OTDR test method <\/td>\n<\/tr>\n
73<\/td>\nFigure I.2 \u2013 Cabling configuration D tested with the OTDR method <\/td>\n<\/tr>\n
74<\/td>\nAnnex J (informative) Launch cord output near-field verification
J.1 Direct verification
J.2 Test equipment manufacturer verification
J.3 Field check with physical artefact
J.3.1 General <\/td>\n<\/tr>\n
75<\/td>\nFigure J.1 \u2013 Initial power measurement
Figure J.2 \u2013 Verification of reference-grade connection
Figure J.3 \u2013 Two offset splices <\/td>\n<\/tr>\n
76<\/td>\nJ.3.2 Procedure for attenuation characterization of artefacts
J.3.3 Construction details
Figure J.4 \u2013 Five offset splices <\/td>\n<\/tr>\n
77<\/td>\nJ.3.4 Example results
Figure J.5 \u2013 EF centred <\/td>\n<\/tr>\n
78<\/td>\nFigure J.6 \u2013 EF underfilling
Figure J.7 \u2013 EF overfilling <\/td>\n<\/tr>\n
79<\/td>\nFigure J.8 \u2013 L1 attenuation with mandrel
Figure J.9 \u2013 L1 attenuation with mandrel and mode conditioner
Figure J.10 \u2013 L2 attenuation with mandrel <\/td>\n<\/tr>\n
80<\/td>\nFigure J.11 \u2013 L2 attenuation with mandrel and mode conditioning
Figure J.12 \u2013 L3 attenuation with mandrel
Figure J.13 \u2013 L3 attenuation with mandrel and mode conditioning <\/td>\n<\/tr>\n
81<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Fibre-optic communication subsystem test procedures – Installed cabling plant. Multimode attenuation measurement<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2023<\/td>\n84<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":431234,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[648,2641],"product_tag":[],"class_list":{"0":"post-431228","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-33-180-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/431228","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/431234"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=431228"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=431228"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=431228"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}