{"id":420069,"date":"2024-10-20T06:29:08","date_gmt":"2024-10-20T06:29:08","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-tr-626322013-2\/"},"modified":"2024-10-26T12:07:37","modified_gmt":"2024-10-26T12:07:37","slug":"bsi-pd-iec-tr-626322013-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-tr-626322013-2\/","title":{"rendered":"BSI PD IEC\/TR 62632:2013"},"content":{"rendered":"

This technical report describes a variety of nanoscale contacts and nano-interconnects used in research and development and in present-day products.<\/p>\n

The intent of this technical report is to identify nanoscale contacts and nano-interconnects that will be common in products, to describe the state-of-the-art and to describe some key features and issues related to these contacts. In particular, the following are discussed in each of the nanoscale contacts or nano-interconnects discussed in Clause 5:<\/p>\n