IEC 62047-3:2006
$7.15
Dispositifs à semiconducteurs – Dispositifs micro électromécaniques – Partie 3 : éprouvette d’essai normalisée en couche mince pour l’essai de traction
| Published By | Publication Date | Number of Pages |
| IEC | 2006-08-15 | 24 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2006-08-15 |
| Pages Count | 24 |
| Language | France |
| Edition | 1.0 |
| File Size | 358.4 KB |
| ICS Codes | 31.080.99 - Other semiconductor devices |
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