IEC 62047-18:2013
$22.75
Dispositifs à semiconducteurs – Dispositif micro électromécaniques – Partie 18 : méthodes d’essai de flexion des matériaux en couche mince
| Published By | Publication Date | Number of Pages |
| IEC | 2013-07-17 | 30 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2013-07-17 |
| Pages Count | 30 |
| Language | France |
| Edition | 1.0 |
| File Size | 1.4 MB |
| ICS Codes | 31.080.99 - Other semiconductor devices |
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