IEC 62047-13:2012
$22.75
Dispositifs à semiconducteurs – Dispositifs micro électromécaniques – Partie 13 : méthodes d’essais de types courbure et cisaillement de mesure de la résistance d’adhérence pour les structures MEMS
| Published By | Publication Date | Number of Pages |
| IEC | 2012-02-28 | 34 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2012-02-28 |
| Pages Count | 34 |
| Language | France |
| Edition | 1.0 |
| File Size | 1.1 MB |
| ICS Codes | 31.080.99 - Other semiconductor devices |
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