BSI DD IEC/PAS 61338-1-5:2010
$142.49
Waveguide type dielectric resonators – General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Published By | Publication Date | Number of Pages |
BSI | 2010 | 24 |
IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.